Patents by Inventor Peter Schoettl

Peter Schoettl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11774360
    Abstract: A method for determining relative degrees of reflectance of a measurement surface, having the method steps of applying measurement radiation to the measurement surface, such that a measurement spot is produced on the management surface, moving the measurement spot along at least a first straight measurement spot path, over the measurement surface in accordance with a first path movement and along a second straight measurement spot path with a second path movement, recording a first and second image sets of a plurality of locally resolved images of the measurement surface during the first path movement and the second path movement. An evaluation is carried out at intersection points, whose location points on the management surface are defined by evaluation lines, wherein a first group of straight evaluation lines within the first measurement path region and a second group of straight evaluation lines within the second measurement path region are predefined and/or determined.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: October 3, 2023
    Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
    Inventors: Gregor Bern, Peter Schöttl, Anna Heimsath, Peter Nitz
  • Patent number: 11380015
    Abstract: A method for the optical determination of an intensity distribution, includes a) producing a spatially inhomogeneous radiation field of electromagnetic radiation; b) producing a first relative movement between a position-resolving image sensor and the radiation source with the radiation field moving along a first measurement path over a sensor field of the image sensor, so it is scanned by a first measurement path region of the radiation field; c) recording a first image set with position-resolved images of the radiation field during the first movement; d) producing a similar second relative movement between the image sensor and the radiation source, along a second measurement path not parallel to the first movement path; d) similarly recording a second image set during the second relative movement; e) evaluating the position-resolved images of the first and second image sets at least at points of intersection, the locations of which are defined by evaluation lines; and f) determining a relative intensity dis
    Type: Grant
    Filed: March 23, 2021
    Date of Patent: July 5, 2022
    Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
    Inventors: Peter Nitz, Anna Heimsath, Peter Schoettl, Gregor Bern, Moritz Bitterling, Thomas Schmidt
  • Publication number: 20210381970
    Abstract: A method for determining relative degrees of reflectance of a measurement surface, having the method steps of applying measurement radiation to the measurement surface, such that a measurement spot is produced on the management surface, moving the measurement spot along at least a first straight measurement spot path, over the measurement surface in accordance with a first path movement and along a second straight measurement spot path with a second path movement, recording a first and second image sets of a plurality of locally resolved images of the measurement surface during the first path movement and the second path movement. An evaluation is carried out at intersection points, whose location points on the management surface are defined by evaluation lines, wherein a first group of straight evaluation lines within the first measurement path region and a second group of straight evaluation lines within the second measurement path region are predefined and/or determined.
    Type: Application
    Filed: September 30, 2019
    Publication date: December 9, 2021
    Applicant: Fraunhofer-Gesellschaft zur Fördergung Der Angewandten Forschung e.V.
    Inventors: Gregor BERN, Peter SCHÖTTL, Anna HEIMSATH, Peter NITZ
  • Publication number: 20210295562
    Abstract: A method for the optical determination of an intensity distribution, includes a) producing a spatially inhomogeneous radiation field of electromagnetic radiation; b) producing a first relative movement between a position-resolving image sensor and the radiation source with the radiation field moving along a first measurement path over a sensor field of the image sensor, so it is scanned by a first measurement path region of the radiation field; c) recording a first image set with position-resolved images of the radiation field during the first movement; d) producing a similar second relative movement between the image sensor and the radiation source, along a second measurement path not parallel to the first movement path; d) similarly recording a second image set during the second relative movement; e) evaluating the position-resolved images of the first and second image sets at least at points of intersection, the locations of which are defined by evaluation lines; and f) determining a relative intensity dis
    Type: Application
    Filed: March 23, 2021
    Publication date: September 23, 2021
    Applicant: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
    Inventors: Peter NITZ, Anna HEIMSATH, Peter SCHOETTL, Gregor BERN, Moritz BITTERLING, Thomas SCHMIDT
  • Patent number: 11073307
    Abstract: The invention relates to a calibration method for a group of reflectors for concentrating solar radiation onto a radiation receiver, having the following steps: A) aligning the reflectors in order to at least partly expose a calibration surface to solar radiation reflected by the reflectors; B) modifying the intensity distribution of the radiation incident on the calibration surface by carrying out a pattern of movements by each reflector of the group, wherein at least one specified parameter for the pattern of movements of each reflector differs from the parameters of the other reflectors, said parameter being selected from the group: —movement frequency,—movement amplitude,—movement phase angle, and—trajectory of the solar radiation, reflected by the reflector, within the calibration surface; C) recording rows of pixels for a plurality of differently located location points of the calibration surface by at least one camera, each row of pixel having at least five temporally offset pixel recordings; D) ascert
    Type: Grant
    Filed: September 26, 2017
    Date of Patent: July 27, 2021
    Assignee: Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V.
    Inventors: Gregor Bern, Peter Schoettl, De Wet Van Rooyen, Peter Nitz, Anna Heimsath
  • Publication number: 20190264953
    Abstract: The invention relates to a calibration method for a group of reflectors for concentrating solar radiation onto a radiation receiver, having the following steps: A) aligning the reflectors in order to at least partly expose a calibration surface to solar radiation reflected by the reflectors; B) modifying the intensity distribution of the radiation incident on the calibration surface by carrying out a pattern of movements by each reflector of the group, wherein at least one specified parameter for the pattern of movements of each reflector differs from the parameters of the other reflectors, said parameter being selected from the group: movement frequency, movement amplitude, movement phase angle, and trajectory of the solar radiation, reflected by the reflector, within the calibration surface; C) recording rows of pixels for a plurality of differently located location points of the calibration surface by at least one camera, each row of pixel having at least five temporally offset pixel recordings; D) ascerta
    Type: Application
    Filed: September 26, 2017
    Publication date: August 29, 2019
    Applicant: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung e.V.
    Inventors: Gregor Bern, Peter Schoettl, De Wet Van Rooyen, Peter Nitz, Anna Heimsath