Abstract: A system and method for evaluating the thermal bond between a heat-producing device and a heat-absorbing apparatus. The heat-producing device may be a CPU, such as an INTEL PENTIUM microprocessor, and the heat-absorbing apparatus may be a heat sink. The two may be joined with a heat-conducting substance such as thermal grease or adhesive. In one exemplary embodiment, the heat-producing device is operated at a first power level, a first temperature measurement is then taken, the device is operated at a second power level, and then a second temperature measurement is then taken. The thermal resistance is then calculated, which may involve subtracting the second temperature from the first, and may involve dividing by the power level. The first power level may be full power, and the second power level may be near zero.

Abstract: A system and method for evaluating the thermal bond between a heat-producing device and a heat-absorbing apparatus. The heat-producing device may be a CPU, such as an INTEL PENTIUM microprocessor, and the heat-absorbing apparatus may be a heat sink. The two may be joined with a heat-conducting substance such as thermal grease or adhesive. In one exemplary embodiment, the heat-producing device is operated at a first power level, a first temperature measurement is then taken, the device is operated at a second power level, and then a second temperature measurement is then taken. The thermal resistance is then calculated, which may involve subtracting the second temperature from the first, and may involve dividing by the power level. The first power level may be full power, and the second power level may be near zero.