Abstract: A system for placing a sample at a predefined measurement location for measuring an optical property of that sample. The apparatus includes a measurement platform for supporting the sample at the measurement location, the measurement platform having an orifice therein beneath the measurement location, and a nozzle configured to retain the sample therein when a vacuum is applied to the nozzle. The sample is contacted by the nozzle, and a vacuum is applied to the nozzle so that the sample is retained therein by air pressure. The nozzle with the sample retained therein is then transported to the measurement location. The vacuum at the nozzle is disabled to release the sample from the nozzle, and a vacuum is applied to the orifice in the measurement platform so as to retain the sample on the measurement platform. The nozzle is then retracted away from the measurement platform.

Abstract: Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location. Apparatus further comprise a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters. The sensed light is received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.

Abstract: An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis.

Abstract: Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location. Apparatus further comprise a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters. The sensed light is received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.

Abstract: An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis.

Abstract: An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis.

Abstract: An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis.