Patents by Inventor Peter Steinberg
Peter Steinberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250271381Abstract: Disclosed is a sensor arrangement, manufacturing apparatus, and measurement method for an additive manufacture apparatus The sensor arrangement includes a sensor module which is configured to detect oxygen molecules in a gas sample permeating into the sensor module and to generate an electrical sensor signal based on the quantity of the oxygen molecules, a control module which is configured, by means of a comparison of the sensor signal or a variable derived from the sensor signal with a specified threshold value, to determine whether the sensor module is measuring outside a predetermined action range and if this is the case, to generate a control signal which is configured to initiate a predetermined countermeasure which is intended to modify the conditions in the apparatus in a manner such that the sensor module is again measuring in the action range.Type: ApplicationFiled: September 13, 2022Publication date: August 28, 2025Inventors: Florian Bayer, Sjoerd Fruijtier, Peter Steinberg, Julian Erath
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Publication number: 20250135554Abstract: The invention concerns a sensor arrangement (9) for an apparatus (1) for the additive manufacture of a component (2) in a manufacturing process in which build material (13), preferably comprising a metal powder, is consolidated on a construction area (8) in a processing area (3) by means of irradiation of the build material (13) with at least one energy beam (AL), the sensor arrangement (9) comprising: a sensor module (90) which is configured to detect oxygen molecules in a gas sample (P) permeating into the sensor module (90) and to generate an electrical sensor signal (S) based on the quantity of the oxygen molecules, a selective filter element (F) configured to filter the gas sample (P) so that at least hydrogen molecules and/or hydrogen ions and/or water molecules and/or hydroxide ions are filtered out of the gas sample (P). The invention further concerns a manufacturing apparatus as well as a measurement method with such a sensor arrangement.Type: ApplicationFiled: September 13, 2022Publication date: May 1, 2025Inventors: Florian Bayer, Sjoerd Fruijtier, Peter Steinberg, Alois Lohr
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Publication number: 20240310277Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.Type: ApplicationFiled: May 20, 2024Publication date: September 19, 2024Inventors: William Robert KEEFE, Gang FENG, Min YAN, William BAYER, Peter STEINBERG
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Patent number: 12038375Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.Type: GrantFiled: June 1, 2022Date of Patent: July 16, 2024Assignee: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLCInventor: Peter Steinberg
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Patent number: 12019014Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.Type: GrantFiled: July 14, 2022Date of Patent: June 25, 2024Assignee: Thermo Electron Scientific Instruments LLCInventors: William Robert Keefe, Gang Feng, Min Yan, William Bayer, Peter Steinberg
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Patent number: 11971352Abstract: A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.Type: GrantFiled: July 14, 2022Date of Patent: April 30, 2024Assignee: Thermo Electron Scientific Instruments LLCInventor: Peter Steinberg
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Publication number: 20230016495Abstract: An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.Type: ApplicationFiled: July 14, 2022Publication date: January 19, 2023Inventors: William Robert Keefe, Gang Feng, Min Yan, William Bayer, Peter Steinberg
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Publication number: 20230016736Abstract: A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.Type: ApplicationFiled: July 14, 2022Publication date: January 19, 2023Inventor: Peter Steinberg
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Publication number: 20220390359Abstract: An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.Type: ApplicationFiled: June 1, 2022Publication date: December 8, 2022Inventor: Peter Steinberg
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Patent number: 10198487Abstract: A computer-assisted method, computer system, and program product provide the functionality of a portal for persons to find, based on a topic of interest, the nearest relevant in-person gathering of other persons interested in the topic as well. The system provides for the automated creation of groups and for their automatic sustainment through automatic scheduling of periodic gatherings. Strangers in geographic proximity are automatically brought together into chapters formed around the topic of interest. Chapters may be led by organizers, and gatherings may have hosts. Automatic functions for venue selection, venue voting, cancellation, and feedback are provided.Type: GrantFiled: May 21, 2015Date of Patent: February 5, 2019Assignee: Meetup, Inc.Inventors: Scott Heiferman, Peter Kamali, Matthew Meeker, Peter Steinberg, Dervala Hanley
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Publication number: 20160259829Abstract: A computer-assisted method, computer system, and program product provide the functionality of a portal for persons to find, based on a topic of interest, the nearest relevant in-person gathering of other persons interested in the topic as well. The system provides for the automated creation of groups and for their automatic sustainment through automatic scheduling of periodic gatherings. Strangers in geographic proximity are automatically brought together into chapters formed around the topic of interest. Chapters may be led by organizers, and gatherings may have hosts. Automatic functions for venue selection, venue voting, cancellation, and feedback are provided.Type: ApplicationFiled: May 21, 2015Publication date: September 8, 2016Inventors: Scott Heiferman, Peter Kamali, Matthew Meeker, Peter Steinberg, Dervala Hanley
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Patent number: 9135663Abstract: A computer-assisted method, computer system, and program product provide the functionality of a portal for persons to find, based on a topic of interest, the nearest relevant in-person gathering of other persons interested in the topic as well. The system provides for the automated creation of groups and for their automatic sustainment through automatic scheduling of periodic gatherings. Strangers in geographic proximity are automatically brought together into chapters formed around the topic of interest. Chapters may be led by organizers, and gatherings may have hosts. Automatic functions for venue selection, venue voting, cancellation, and feedback are provided.Type: GrantFiled: June 15, 2004Date of Patent: September 15, 2015Assignee: Meetup, Inc.Inventors: Scott Heiferman, Peter Kamali, Matthew Meeker, Peter Steinberg, Dervala Hanley
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Patent number: 6635692Abstract: A range of extruded polymers incorporating synthetic furanones was manufactured and field tested. Polymers incorporating furanones showed excellent antifouling efficacy and significantly reduced fouling for more than 100 days. The present inventors have developed polymers that release commercial short-lived biocides or analogues of antifouling compounds isolated from marine algae. A range of polymers incorporating either the commercial isothiazolone Sea-Nine 211™ or a halogenated furanone were effective antifouling treatments in laboratory and field trials. The efficacy of the polymers was dependant on polymer type and the initial concentration of the antifouling compound. The polymers can be extruded as filaments that can be woven into netting or extruded or molding for other applications.Type: GrantFiled: April 20, 2001Date of Patent: October 21, 2003Assignee: Aquaculture CRC LimitedInventors: Gregor Bruce Yeo Christie, Victor Christov, Peter Canisius De Nys, Peter Steinberg, Stephen Hodson
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Patent number: 5111777Abstract: An evaporation cooling system for an internal-combustion engine controls venting through a valve as a function of the temperature. The escape of water vapor is prevented when the vent valve is not yet actuated.Type: GrantFiled: January 17, 1991Date of Patent: May 12, 1992Assignee: Bayerische Motoren Werke AGInventors: Peter Steinberg, Peter Kinninger