Abstract: The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors. The first sensor (17) measures the profile of the total thickness in a short cycle with a duration of approximately 1-2 minutes, but with a large measuring error margin. The second sensor (16) measures the profile of the total thickness with a small measuring error margin but in a long cycle with a duration of approximately 10 to 30 minutes. A correction profile for the first sensor (17) can be calculated by comparing the two thickness profiles.

Abstract: The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors, whereby all the sensors take a measurement at the same location under the same conditions if possible. The first sensor (17) and the second (16) or additional sensors generate different measured values for layers of the multi-layer film (13) of the same thickness consisting of the same material (13). The measured signals of the sensors (16, 17) are fed to a computer (18), which determines the total thickness of the multi-layer film (13) and/or the thickness of the individual layers of the multi-layer film (13) from the different measured values of the first sensor (17) and the second (16) or additional sensors.

Abstract: The invention relates to a method for determining the thickness of multi-layer films (13) comprising layers consisting of various non-conductive materials. According to said method, the thickness of the multi-layer film (13) is measured by a first sensor (17) and a second sensor (16) and optionally additional sensors. The first sensor (17) measures the profile of the total thickness in a short cycle with a duration of approximately 1-2 minutes, but with a large measuring error margin. The second sensor (16) measures the profile of the total thickness with a small measuring error margin but in a long cycle with a duration of approximately 10 to 30 minutes. A correction profile for the first sensor (17) can be calculated by comparing the two thickness profiles.

Abstract: The object of positioning a measurement probe (5) very close to but not in contact with moving measured material (9) is solved in accordance with the invention in that air is blown through a nozzle in the measurement probe between the probe and the material being measured, and in that the pressure in the flowing medium between the measurement probe and the material being measured is measured, and from this a regulation signal is derived for the spacing. The air cushion which forms between the material being measured and the measurement probe, on the one hand, prevents mutual contact and additionally serves as a medium in the measuring system for the measurement of the spacing.