Patents by Inventor Peter T. Jones

Peter T. Jones has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10372315
    Abstract: A method for providing a virtual conference is described. The method includes: a conferencing system receiving a request to schedule a meeting; the conferencing system displaying a calendar associated with a first conference participant identifier of the virtual conference; and the conferencing system receiving a request to retrieve calendar data associated with one or more second conference participant identifiers of the virtual conference. The conferencing system then receives calendar data through one or more communication channels associated with one or more second conference participant identifiers.
    Type: Grant
    Filed: April 30, 2010
    Date of Patent: August 6, 2019
    Assignee: American Teleconferencing Services, Ltd
    Inventors: Boland T. Jones, Peter Stewart, David Michael Guthrie, Scott A. Schemmel
  • Publication number: 20170370799
    Abstract: Methods and apparatuses are provided for evaluating or testing stiction in Microelectromechanical Systems (MEMS) devices utilizing a mechanized shock pulse generation approach. In one embodiment, the method includes the step or process of loading a MEMS device, such as a multi-axis MEMS accelerometer, into a socket provided on a Device-Under-Test (DUT) board. After loading the MEMS device into the socket, a series of controlled shock pulses is generated and transmitted through the MEMS device utilizing a mechanized test apparatus. The mechanized test apparatus may, for example, repeatedly move the DUT board over a predefined motion path to generate the controlled shock pulses. In certain cases, transverse vibrations may also be directed through the tested MEMS device in conjunction with the shock pulses. An output of the MEMS device is then monitored to determine whether stiction of the MEMS device occurs during each of the series of controlled shock pulses.
    Type: Application
    Filed: June 22, 2016
    Publication date: December 28, 2017
    Applicant: FREESCALE SEMICONDUCTOR INC.
    Inventors: PETER T. JONES, ARVIND SALIAN, WILLIAM D. MCWHORTER, CHAD KRUEGER, JOHN SHIPMAN, MICHAEL NAUMANN, LARRY D. METZLER, TRIPTI REGMI
  • Patent number: 9612309
    Abstract: Manufacturing of magnetometer units employs a test socket having a substantially rigid body with a cavity therein holding an untested unit in a predetermined position proximate electrical connection thereto, wherein one or more magnetic field sources fixed in the body provide known magnetic fields at the position so that the response of each unit is measured and compared to stored expected values. Based thereon, each unit can be calibrated or trimmed by feeding corrective electrical signals back to the unit through the test socket until the actual and expected responses match or the unit is discarded as uncorrectable. In a preferred embodiment, the magnetic field sources are substantially orthogonal coil pairs arranged so that their centerlines coincide at a common point within the predetermined position. Because the test-socket is especially rugged and compact, other functions (e.g., accelerometers) included in the unit can also be easily tested and trimmed.
    Type: Grant
    Filed: January 16, 2015
    Date of Patent: April 4, 2017
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Peter T. Jones, David T. Myers, Franklin P. Myers, Jim D. Pak
  • Patent number: 9543067
    Abstract: Methods, systems and apparatus are provided to apply a magnetic pre-conditioning to magnetic tunneling junction (MTJ) sensors and other micro-magnetic devices after fabrication but before testing, trimming or other subsequent processing. The fabricated sensor device is passed through a magnetic field that has a known direction and orientation relative to the device so that the device is placed into a known state prior to final testing and trimming. Various embodiments allow the field to be applied in situ by a permanent magnet or electromagnet as the devices are being processed by a conventional device handler or similar processing system.
    Type: Grant
    Filed: December 20, 2013
    Date of Patent: January 10, 2017
    Assignee: NXP USA, INC.
    Inventors: Carlos M. Acuna, Mohammad A. Faruque, Kevin R. Fugate, Todd D. Hoffmann, Paige M. Holm, Peter T. Jones, Rigoberto Lopez, Jr., William D. McWhorter
  • Patent number: 9527731
    Abstract: A method for testing a plurality of pressure sensors on a device wafer includes placing a diaphragm of one of the pressure sensors on the device wafer in proximity to a nozzle of a test system. A pneumatic pressure stimulus is applied to the diaphragm via an outlet of the nozzle and a cavity pressure is measured within a cavity associated with the pressure sensor in response to application of the pneumatic pressure stimulus. The pneumatic pressure stimulus within the cavity corresponds to the pressure applied to the diaphragm. Methodology is executed to test the strength and/or stiffness of the diaphragm. Additionally, the methodology and test system can be utilized to determine an individual calibration factor for each pressure sensor on the device wafer.
    Type: Grant
    Filed: October 15, 2014
    Date of Patent: December 27, 2016
    Assignee: NXP USA, Inc.
    Inventors: Bruno J. Debeurre, Peter T. Jones, William D. McWhorter, Raimondo P. Sessego
  • Patent number: 9488542
    Abstract: A pressure sensor (20) includes a test cell (32) and sense cell (34). The sense cell (34) includes an electrode (42) formed on a substrate (30) and a sense diaphragm (68) spaced apart from the electrode (42) to produce a sense cavity (64). The test cell (32) includes an electrode (40) formed on the substrate (30) and a test diaphragm (70) spaced apart from the electrode (40) to produce a test cavity (66). Both of the cells (32, 34) are sensitive to pressure (36). However, a critical dimension (76) of the sense diaphragm (68) is less than a critical dimension (80) of the test diaphragm (70) so that the test cell (32) has greater sensitivity (142) to pressure (36) than the sense cell (34). Parameters (100) measured at the test cell (32) are utilized to estimate a sensitivity (138) of the sense cell (34).
    Type: Grant
    Filed: August 11, 2015
    Date of Patent: November 8, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Chad S. Dawson, Peter T. Jones
  • Patent number: 9400226
    Abstract: Embodiments of systems for calibrating transducer-including devices include a board support structure, one or more motors, a motor control module, and a calibration control module. The board support structure holds a calibration board in a fixed position with respect to the board support structure. The motor(s) rotate the board support structure around one or more axes of a fixed coordinate system. The motor control module sends motor control signals to the motor(s) to cause the motor(s) to move the board support structure through a series of orientations with respect to the fixed coordinate system. The calibration control module sends, through a communication structure, signals to the transducer-including devices, which are loaded into a plurality of sockets of the calibration board. The signals cause the transducer-including devices to generate transducer data while the board support structure is in or moving toward each orientation of the series of orientations.
    Type: Grant
    Filed: April 9, 2013
    Date of Patent: July 26, 2016
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Raimondo P. Sessego, Peter T. Jones, Seyed K. Paransun, James D. Stanley, William D. McWhorter
  • Patent number: 9365413
    Abstract: Embodiments of packaged transducer-including devices and methods for their calibration are disclosed. Each device includes one or more transducers, an interface configured to facilitate communications with an external calibration controller, a memory, and a processing component. The external calibration controller sends calibration commands to the transducer-including devices through a communication structure. The processing component of each device executes code in response to receiving the calibration commands. Execution of the code includes generating transducer data from the one or more transducers, calculating calibration coefficients using the transducer data, and storing the calibration coefficients within the memory of the device.
    Type: Grant
    Filed: August 8, 2013
    Date of Patent: June 14, 2016
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Andres Barrilado, Peter T. Jones, Stephane Lestringuez, Seyed K. Paransun, Raimondo P. Sessego, James D. Stanley
  • Publication number: 20160116361
    Abstract: A system for testing pressure sensors on a device wafer includes a tray for holding the device wafer. The tray includes a base having a surface, a spacer extending from the surface, and a tacky material disposed on the surface. The spacer holds the device wafer spaced apart from the surface of the base to form a chamber between the surface and the device wafer. A wafer chuck retains the tray and the device wafer under vacuum. The system further includes a nozzle and a seal element in fixed engagement with the nozzle. The seal element surrounds the outlet of the nozzle and is adapted for mechanical contact with the device wafer. An actuator is configured to place the nozzle and a diaphragm of one of the pressure sensors in proximity to one another, wherein a pneumatic pressure stimulus is applied to the diaphragm via an outlet of the nozzle.
    Type: Application
    Filed: October 28, 2014
    Publication date: April 28, 2016
    Inventors: BRUNO J. DEBEURRE, ALBERT S. CHECKANOV, JANSEN D. CURRENS, PETER T. JONES, WILLIAM D. MCWHORTER, RAIMONDO P. SESSEGO
  • Publication number: 20160107887
    Abstract: A method for testing a plurality of pressure sensors on a device wafer includes placing a diaphragm of one of the pressure sensors on the device wafer in proximity to a nozzle of a test system. A pneumatic pressure stimulus is applied to the diaphragm via an outlet of the nozzle and a cavity pressure is measured within a cavity associated with the pressure sensor in response to application of the pneumatic pressure stimulus. The pneumatic pressure stimulus within the cavity corresponds to the pressure applied to the diaphragm. Methodology is executed to test the strength and/or stiffness of the diaphragm. Additionally, the methodology and test system can be utilized to determine an individual calibration factor for each pressure sensor on the device wafer.
    Type: Application
    Filed: October 15, 2014
    Publication date: April 21, 2016
    Inventors: BRUNO J. DEBEURRE, PETER T. JONES, WILLIAM D. MCWHORTER, RAIMONDO P. SESSEGO
  • Patent number: 9285404
    Abstract: A test structure includes two capacitor structures, wherein one of the capacitor structures has conductor plates spaced apart by a cavity, and the other capacitor structure does not include a cavity. Methodology entails forming the test structure and a pressure sensor on the same substrate using the same fabrication process techniques. Methodology for estimating the sensitivity of the pressure sensor includes detecting capacitances for each of the two capacitor structures and determining a ratio of the capacitances. A critical dimension of the cavity in one of the capacitor structures is estimated using the ratio, and the sensitivity of the pressure sensor is estimated using the critical dimension.
    Type: Grant
    Filed: August 15, 2013
    Date of Patent: March 15, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Chad S. Dawson, Peter T. Jones, Bruno J. Debeurre
  • Patent number: 9285289
    Abstract: A MEMS pressure sensor (70) includes a sense cell (80), a test cell (82), and a seal structure (84). The test cell includes a test cavity (104), and the seal structure (84) is in communication with the test cavity, wherein the seal structure is configured to be breached to change an initial cavity pressure (51) within the test cavity (104) to ambient pressure (26). Calibration methodology (180) entails obtaining (184) a test signal (186) from the test cell prior to breaching the seal structure, and obtaining (194) another test signal (196) after the seal structure is breached. The test signals are used to calculate a sensitivity (200) of the test cell, the calculated sensitivity is used to estimate the sensitivity (204) of the sense cell, and the estimated sensitivity (204) can be used to calibrate the sense cell.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: March 15, 2016
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Chad S. Dawson, Peter T. Jones
  • Patent number: 9285422
    Abstract: A tester configured to test a strip of devices is provided. The tester may include a communications system, a plurality of communication lines, a plurality of multiplexors, each multiplexor having at least two outputs, wherein each multiplexor is configured to receive a signal generated by the communications system via one of the plurality of communication lines, and each multiplexor may be selectably coupled to at least two of the devices in the strip of devices. The tester may be configured to index the plurality of communication lines to a first subset of the devices, initiate at least one test, command the devices to generate data for each of the at least one tests, retrieve data from a first set of the devices, and retrieve data from a second set of the devices.
    Type: Grant
    Filed: May 7, 2012
    Date of Patent: March 15, 2016
    Assignee: FREESCALE SEMICONDUCTOR INC.
    Inventors: Chad S. Dawson, Stephen R. Hooper, Peter T. Jones, Mark E. Schlarmann
  • Patent number: 9213045
    Abstract: A mechanism for recovering from stiction-related events in a MEMS device through application of a force orthogonal to the stiction force is provided. A small force applied orthogonal to the vector of a stiction force can release the stuck proof mass easier than a force parallel to the vector of the stiction force. Example embodiments provide a vertical parallel plate or comb-fingered lateral actuator to apply the orthogonal force. Alternate embodiments provide a proof mass of a second transducer to impact a stuck MEMS actuator to release stiction.
    Type: Grant
    Filed: May 23, 2013
    Date of Patent: December 15, 2015
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Kemiao Jia, Peter T. Jones
  • Publication number: 20150346046
    Abstract: A pressure sensor (20) includes a test cell (32) and sense cell (34). The sense cell (34) includes an electrode (42) formed on a substrate (30) and a sense diaphragm (68) spaced apart from the electrode (42) to produce a sense cavity (64). The test cell (32) includes an electrode (40) formed on the substrate (30) and a test diaphragm (70) spaced apart from the electrode (40) to produce a test cavity (66). Both of the cells (32, 34) are sensitive to pressure (36). However, a critical dimension (76) of the sense diaphragm (68) is less than a critical dimension (80) of the test diaphragm (70) so that the test cell (32) has greater sensitivity (142) to pressure (36) than the sense cell (34). Parameters (100) measured at the test cell (32) are utilized to estimate a sensitivity (138) of the sense cell (34).
    Type: Application
    Filed: August 11, 2015
    Publication date: December 3, 2015
    Inventors: CHAD S. DAWSON, Peter T. Jones
  • Patent number: 9176020
    Abstract: A pressure sensor (20) includes a test cell (32) and sense cell (34). The sense cell (34) includes an electrode (42) formed on a substrate (30) and a sense diaphragm (68) spaced apart from the electrode (42) to produce a sense cavity (64). The test cell (32) includes an electrode (40) formed on the substrate (30) and a test diaphragm (70) spaced apart from the electrode (40) to produce a test cavity (66). Both of the cells (32, 34) are sensitive to pressure (36). However, a critical dimension (76) of the sense diaphragm (68) is less than a critical dimension (80) of the test diaphragm (70) so that the test cell (32) has greater sensitivity (142) to pressure (36) than the sense cell (34). Parameters (100) measured at the test cell (32) are utilized to estimate a sensitivity (138) of the sense cell (34).
    Type: Grant
    Filed: October 1, 2013
    Date of Patent: November 3, 2015
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Chad S. Dawson, Peter T. Jones
  • Publication number: 20150179325
    Abstract: Methods, systems and apparatus are provided to apply a magnetic pre-conditioning to magnetic tunneling junction (MTJ) sensors and other micro-magnetic devices after fabrication but before testing, trimming or other subsequent processing. The fabricated sensor device is passed through a magnetic field that has a known direction and orientation relative to the device so that the device is placed into a known state prior to final testing and trimming. Various embodiments allow the field to be applied in situ by a permanent magnet or electromagnet as the devices are being processed by a conventional device handler or similar processing system.
    Type: Application
    Filed: December 20, 2013
    Publication date: June 25, 2015
    Inventors: CARLOS M. ACUNA, MOHAMMAD A. FARUQUE, KEVIN R. FUGATE, TODD D. HOFFMANN, PAIGE M. HOLM, PETER T. JONES, RIGOBERTO LOPEZ, JR., WILLIAM D. MCWHORTER
  • Publication number: 20150160089
    Abstract: A MEMS pressure sensor (70) includes a sense cell (80), a test cell (82), and a seal structure (84). The test cell includes a test cavity (104), and the seal structure (84) is in communication with the test cavity, wherein the seal structure is configured to be breached to change an initial cavity pressure (51) within the test cavity (104) to ambient pressure (26). Calibration methodology (180) entails obtaining (184) a test signal (186) from the test cell prior to breaching the seal structure, and obtaining (194) another test signal (196) after the seal structure is breached. The test signals are used to calculate a sensitivity (200) of the test cell, the calculated sensitivity is used to estimate the sensitivity (204) of the sense cell, and the estimated sensitivity (204) can be used to calibrate the sense cell.
    Type: Application
    Filed: December 6, 2013
    Publication date: June 11, 2015
    Inventors: Chad S. Dawson, Peter T. Jones
  • Publication number: 20150130443
    Abstract: Manufacturing of magnetometer units employs a test socket having a substantially rigid body with a cavity therein holding an untested unit in a predetermined position proximate electrical connection thereto, wherein one or more magnetic field sources fixed in the body provide known magnetic fields at the position so that the response of each unit is measured and compared to stored expected values. Based thereon, each unit can be calibrated or trimmed by feeding corrective electrical signals back to the unit through the test socket until the actual and expected responses match or the unit is discarded as uncorrectable. In a preferred embodiment, the magnetic field sources are substantially orthogonal coil pairs arranged so that their centerlines coincide at a common point within the predetermined position. Because the test-socket is especially rugged and compact, other functions (e.g., accelerometers) included in the unit can also be easily tested and trimmed.
    Type: Application
    Filed: January 16, 2015
    Publication date: May 14, 2015
    Inventors: Peter T. Jones, David T. Myers, Franklin P. Myers, Jim D. Pak
  • Patent number: 9027759
    Abstract: A sorting apparatus is described, and which includes a conveyor which transports a produce stream for inspection. A product separation surface is mounted near the distal end of the conveyor, and the produce stream passes over the product separation surface, and is slowed to a speed such that the produce stream falls substantially immediately vertically downwardly. An inspection zone is located downstream relative to the product separation surface. An imaging device is provided, and which images the produce stream passing through the inspection zone; an illumination device is provided for illuminating the produce stream passing through the inspection zone, and an ejector assembly is located downstream of the inspection zone and which removes unwanted solid material in the produce stream having undesirable characteristics.
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: May 12, 2015
    Assignee: Key Technology, Inc.
    Inventors: Peter T. Jones, Brandon T. Hall, David W. Hufford, Timothy L. Justice, Tracy L. McGowen, Gerald R. Richert, Roydan T. Tomlinson, Jean-Francois Pellet