Abstract: Methods and apparatus for calibrating a vector network analyzer (VNA) and characterizing a device under test. In one example, a device fixture including a pair of embedded device adapters provides an interface between a device under test (DUT) with non-coaxial connectors and the coaxial connectors of the VNA, and moves the calibration reference plane from the coaxial connectors of the VNA to a DUT reference plane at the leads/connectors of the DUT. A through fixture having a pair of similar through adapters is used to establish the DUT reference plane and to facilitate characterizing the device adapters such that they can be de-embedded from measurements of the device fixture.

Abstract: A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Abstract: According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.

Abstract: A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Abstract: A method and apparatus for characterizing a device under test (“DUT”) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation. The scalar orthogonal matrix [M] comprises a row of elements representing a single-ended terminal of the DUT, and four rows of elements representing a balanced terminal of the DUT. The S-parameters of the DUT are then transformed into mixed-mode S-parameters [Smm] according to Smm=MSM−1. A method of and apparatus for characterizing a DUT involves calibrating a multiport test set, coupling the DUT to the multiport test set, and measuring S-parameters of the DUT. The S-parameters are converted to a time domain representation and at least one of the S-parameters is convolved with a simulated input signal to generate an output response.

Abstract: According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: An electronic microwave calibration device provides an electronic load connected to each of two ports of a vector network analyzer. The load comprises a plurality of PIN diodes interconnected by transmission line. Each of the diodes are biased to generate different loads or conditions at each of the two ports. A control computer controls the biasing of diodes according to a predetermined procedure and compares impedance values measured at each of the two ports by the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are stored in the network analyzer and used by the network analyzer in performing further measurements.

Abstract: A programmable microwave network test device is capable of establishing a multitude of reflection and transmission coefficients determined by a set of digital inputs. The programmable network enables the collection of groups of measurements which are used to characterize a non-linear or linear device. The microwave structure of the network is comprised of a series of PIN diodes interconnected through microstrip transmission lines. The lengths of the transmission lines between the PIN divide are proportioned so as to allow use of the network over a broad frequency range, with a minimization of repeated reflection coefficients in a use of the network, the device to be characterized would be placed at the input port of the network with the output port of the network terminated in its characteristic impedance.