Abstract: An apparatus for prealigning a silicon wafer prior to transfer to a work station. The wafer is spun on an aligning platform by means of air jets emanating from holes disposed in the surface of the platform while simultaneously being stopped by means of a vacuum source communicating with the surface of the platform. Sensor means detect when the wafer is centered within a first predetermined tolerance to turn off the air jets and vacuum to stop the wafer. Control means responsive to the sensor means then center the wafer to within a second predetermined tolerance. The wafer is then transported to the work station for processing.

Abstract: Reeled axial-lead devices such as diodes, resistors, capacitors, inductors, transistors and SCRs are carried in linear array by two coextensive tapes wound about a reel. The reel-to-reel apparatus of the invention includes a take-up reel and drive means for conveying the taped electrical components from the supply reel to the take up reel, and disposed intermediate said conveyor is an environmental chamber through which the taped reel is threaded. While in the environmental chamber, the electrical components and the tapes are selectively subjected to differential temperatures whereby only the electrical components are heated or cooled to the desired temperature preparatory to testing. Subsequentially, each electrical component is sequentially tested, and if found defective, is removed from the tape carrier by cutter means. The reeled components are then wound about the take-up reel.

Abstract: An automatic testing machine which picks up electrical components such as transistors from a feed mechanism and feeds them to spaced clamped positions at the periphery of a test wheel. The test wheel is turned by a stepper motor and the electrical devices are tested at one or more positions by clamping their terminals between two jaws, which contain contact fingers connected to test circuits. After testing, the results are registered in an electronic memory circuit and made available for a sorting action. A series of chutes and bins is positioned around the test wheel and the tested devices are discharged into the bins according to the results of the tests. A fast stepping motor and a low inertia test wheel permit test proceedures of high speed.