Patents by Inventor Peter W. Stephens

Peter W. Stephens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction inspection system
    Patent number: 5007072
    Abstract: An inspection system for detecting the presence of selected crystalline materials, such as explosives or drugs, utilizing an x-ray source and a collimated array of detectors to sense radiation scattered by the objects being inspected. A signal processing system compares the measured signal with selected spectra to determine whether specific materials are present within the inspected object.
    Type: Grant
    Filed: August 3, 1988
    Date of Patent: April 9, 1991
    Assignee: Ion Track Instruments
    Inventors: Anthony Jenkins, Peter W. Stephens