Abstract: Embodiments of the present invention provide cooling for a test array (e.g., a semiconductor test array) using a 2-phase refrigerant. Testing can be performed without any added insulation, which improves test site density significantly. The refrigerant can be provided by any suitable refrigerant source, such as a pump or valve-controlled pressure chamber, for example, and can be provided to a cold plate of a test site, for example. The cold plate can include a flow field or flow channels for guiding the refrigerant to evenly cool surfaces and/or prevent condensation forming on outer surfaces of the cold plate or test site.

Abstract: A two-phase thermal system to provide cooling and heating for device testing. The two-phase thermal system utilizes a refrigeration system to cool one or more devices under test (DUTs) in a cooling mode, and heat the one or more DUTs in a heating mode. The available heat content of the hot gas from the compressor is greater than the evaporator cooling capacity of the refrigeration system, and therefore the two-phase thermal system can be utilized to both cool and heat the one or more DUTs.

Abstract: A fuel cell system for converting a first flow and a second flow to electricity, a first spent flow, and a second spent flow. The fuel cell system may include a chamber for combusting the first spent flow and the second spent flow to produce heat and a pathway for the first flow. The pathway may be positioned about the chamber for heat exchange therewith.