Patents by Inventor Peter Wilhelm Wurfel

Peter Wilhelm Wurfel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determining diffusion length of minority carriers using luminescence
    Patent number: 7919762
    Abstract: Methods (200, 300), apparatuses and systems (100) for determining minority carrier diffusion lengths in a semi-conductor structure (130), which may be a solar cell or a unprocessed or partially processed silicon sample, are disclosed. The luminescence (140) may comprise photoluminescence, electroluminescence, or both. Luminescence (140) is excited (212) in the structure (130), and the intensities of short- and long-wavelength luminescence (140) are measured (214). Luminescence intensities may be captured from either side of the sample using a single photodetector, a FPA, a CCD array (150), or a mapping tool. The luminescence (140) excited in the structure (130) may be filtered (160) at short and long cutoff wavelengths. Diffusion lengths of the structure (130) are generated (216) using a predefined theoretical relationship.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: April 5, 2011
    Assignee: BT Imaging Pty Ltd
    Inventors: Thorsten Trupke, Robert Andrew Bardos, Peter Wilhelm Wurfel
  • DETERMINING DIFFUSION LENGTH OF MINORITY CARRIERS USING LUMINESCENCE
    Publication number: 20100025588
    Abstract: Methods (200, 300), apparatuses and systems (100) for determining minority carrier diffusion lengths in a semi-conductor structure (130), which may be a solar cell or a unprocessed or partially processed silicon sample, are disclosed. The luminescence (140) may comprise photoluminescence, electroluminescence, or both. Luminescence (140) is excited (212) in the structure (130), and the intensities of short- and long-wavelength luminescence (140) are measured (214). Luminescence intensities may be captured from either side of the sample using a single photodetector, a FPA, a CCD array (150), or a mapping tool. The luminescence (140) excited in the structure (130) may be filtered (160) at short and long cutoff wavelengths. Diffusion lengths of the structure (130) are generated (216) using a predefined theoretical relationship.
    Type: Application
    Filed: July 27, 2007
    Publication date: February 4, 2010
    Applicant: BT IMAGING PTY LTD.
    Inventors: Thorsten Trupke, Robert Andrew Bardos, Peter Wilhelm Wurfel