Patents by Inventor Peter William HAYLES

Peter William HAYLES has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • XRF detector and source calibration apparatus
    Patent number: 10012604
    Abstract: An apparatus includes at least one X-ray source that emits X-rays toward a sample, an X-ray fluorescence (XRF) detector that detects X-ray radiation scattered from the sample, an internal standard that emits scattered X-ray radiation in response to X-rays emitted from the at least one X-ray source, and a carriage assembly that translates the at least one X-ray source and XRF detector between a sample measurement position and an internal standard measurement position.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: July 3, 2018
    Assignee: THERMO GAMMA-METRICS PTY LTD
    Inventors: Bryan John Crosby, Simon Liemar, Peter William Hayles, Charlie Minghua Mao, Tejas Indravadanbhai Shah, Hao Zeng
  • XRF DETECTOR AND SOURCE CALIBRATION APPARATUS
    Publication number: 20170167990
    Abstract: An apparatus includes at least one X-ray source that emits X-rays toward a sample, an X-ray fluorescence (XRF) detector that detects X-ray radiation scattered from the sample, an internal standard that emits scattered X-ray radiation in response to X-rays emitted from the at least one X-ray source, and a carriage assembly that translates the at least one X-ray source and XRF detector between a sample measurement position and an internal standard measurement position.
    Type: Application
    Filed: December 15, 2015
    Publication date: June 15, 2017
    Inventors: Bryan John CROSBY, Simon LIEMAR, Peter William HAYLES, Charlie Minghua MAO, Tejas Indravadanbhai SHAH, Hao ZENG