Abstract: A method and an apparatus for guiding and collecting light which issues from a light source and which is passed in the form of an incident primary beam to a specimen or like material to be measured are intended to optimize guiding and collecting the light. That aim is achieved by a method wherein the material to be measured is disposed at a focus of a reflection surface formed at least as half an ellipsoid of revolution, and beams leaving said material are reflected at the reflection surface. In that connection, the primary beam is emitted directly in the center of the material to be measured. An apparatus of the kind set forth above is characterized in that at least the material (14) to be measured is surrounded by a reflection surface in the form at least of a half ellipsoid of revolution (13) and the material (14) to be measured is disposed at the focus (F1) thereof.

Abstract: A method and an apparatus for guiding and collecting light which arises or is reflected from a sample to be measured is described. The method and apparatus are intended to optimize guiding and collecting the light primarily in fluorimetry, nephelometry, luminometry and the like. The foregoing is achieved by a method which fixes the sample in a first focus of a reflector chamber having an ellipsoidal or paraboidal reflector surface of at least a half ellipsoid of revolution or paraboloid of revolution, and uses beams leaving that material which are reflected by the reflection surface. An apparatus of the kind set forth above is characterized in that at least the material to be measured is surrounded by a reflection surface of at least 2 PI sterradians of ellipsoidal or paraboloidal shape. Detectable light signals are received by a photosensitive surface positioned between a second focus of the reflector chamber and the center of the body of revolution for the case of the ellipsoid.