Abstract: A method of measuring signal delay in a integrated circuit comprising applying a common clock signal at a circuit input and output, applying a test signal at the circuit input, detecting a corresponding output signal at the circuit output and detecting whether the test signal and output signal occur in a common part of the clock signal.

Abstract: A method of measuring signal delay in a integrated circuit comprising applying a common clock signal at a circuit input and output, applying a test signal at the circuit input, detecting a corresponding output signal at the circuit output and detecting whether the test signal and output signal occur in a common part of the clock signal.

Abstract: A method of generating a user circuit implementation for programming a PLD comprising generating a set of user circuit implementation configuration candidates, measuring one or more characteristics of the PLD in a measurement phase and selecting a user circuit implementation from the set of candidates based on a measured characteristic.

Abstract: This invention provides a logic block comprising an mxn array of partial calculating circuits (where m≧2 and n≧2) operable to generate partial product components of an m-bit multiplicand x n-bit multiplicand binary multiplication and to generate a cumulative sum of the partial products for each bit of one of the multiplicands. A configurable output circuit which is operable under the control of a configuration signal either (a) to sum the cumulative sums of partial products generated by the partial calculating circuits so as to generate a product value, or (b) to pass data representing the cumulative sums of the partial product components to partial calculating circuits within one or more further logic blocks. Also provided is a logic circuit including two or more such logic blocks, data interconnections for data transfer between the logic blocks and control interconnections for control signal transfer to the logic blocks.