Patents by Inventor Peter Zwigl

Peter Zwigl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Focused ion beam microlathe
    Patent number: 6838683
    Abstract: An apparatus for customizing focused ion beam (FIB) probes is described. Prior to taking probe measurements, the probe tips are milled with a beam of gallium ions on a microlathe platform. A motor rotates the probes such that the probe tips are uniformly milled.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: January 4, 2005
    Assignee: Intel Corporation
    Inventors: Mary B. Stevens, Peter Zwigl
  • FOCUSED ION BEAM MICROLATHE
    Publication number: 20040256577
    Abstract: An apparatus for customizing focused ion beam (FIB) probes is described. Prior to taking probe measurements, the probe tips are milled with a beam of gallium ions on a microlathe platform. A motor rotates the probes such that the probe tips are uniformly milled.
    Type: Application
    Filed: June 18, 2003
    Publication date: December 23, 2004
    Inventors: Mary B. Stevens, Peter Zwigl
  • Chemically induced plastic deformation
    Patent number: 6355120
    Abstract: The invention produces mismatch plastic deformation in a workpiece by altering the chemical composition of the workpiece material, while the workpiece is subjected to a biasing stress, in a manner that introduces a strain increment into the material, deforming the workpiece without causing failure. In one approach, repeated cyclic alteration of chemical composition, so as to repeatedly alternately induce and reverse a phase transition that produces strain increment, allows accumulation of strain in an incremental fashion thereby achieving overall large, superplastic deformations in the workpiece without applying large stresses.
    Type: Grant
    Filed: December 23, 1999
    Date of Patent: March 12, 2002
    Assignee: Massachusetts Institue of Technology
    Inventors: David C. Dunand, Peter Zwigl
  • Chemically induced superplastic deformation
    Patent number: 6042661
    Abstract: The invention produces superplastic deformation in a workpiece by altering the chemical composition of the workpiece material, while the workpiece is subjected to a biasing stress, in a manner that introduces a strain increment into the material that effects a change in a overall dimension of the workpiece without causing failure. In one approach, repeated cyclic alteration of chemical composition, so as to repeatedly alternately induce and reverse a phase transition that produces strain increment, allows accumulation of strain in an incremental fashion thereby achieving large overall superplastic deformations in the workpiece without applying large stresses.
    Type: Grant
    Filed: March 19, 1997
    Date of Patent: March 28, 2000
    Assignee: Massachusetts Institute of Technology
    Inventors: David C. Dunand, Peter Zwigl