Patents by Inventor Petr Panek

Petr Panek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of forming a gettering structure having reduced warpage and gettering a semiconductor wafer therewith
    Patent number: 8846500
    Abstract: At least one exemplary embodiment is directed to a method of forming a multilayered gettering structure that can be used to control wafer warpage.
    Type: Grant
    Filed: December 13, 2010
    Date of Patent: September 30, 2014
    Assignee: Semiconductor Components Industries, LLC
    Inventors: David Lysacek, Jana Vojtechovska, Lubomir Dornak, Petr Kostelnik, Lukas Valek, Petr Panek
  • METHOD OF FORMING A GETTERING STRUCTURE AND THE STRUCTURE THEREFOR
    Publication number: 20120146024
    Abstract: At least one exemplary embodiment is directed to a method of forming a multilayered Bettering structure that can be used to control wafer warpage.
    Type: Application
    Filed: December 13, 2010
    Publication date: June 14, 2012
    Inventors: David Lysacek, Jana Vojtechovska, Lubomir Dornak, Petr Kostelnik, Lukas Valek, Petr Panek
  • Time interval measurement device
    Patent number: 7057978
    Abstract: A device for high accurate measurement of time intervals is based on the conversion of the time interval to a sequence of samples of the response of a surface acoustic wave filter excited at the beginning and at the end of the measured interval. In one of its configurations, the time interval measurement device includes the input of the pulse signal, the filter exciter, the surface acoustic wave filter, the amplifier, the sampler, the analog-to-digital converter, the sample register, the register of sample numbers, the voltage comparator, the control circuit, the sample counter, the computer, the output of the reference clock signal source, and the output of the measured time intervals.
    Type: Grant
    Filed: August 20, 2004
    Date of Patent: June 6, 2006
    Inventor: Petr Pánek
  • Time interval measurement device
    Publication number: 20050052952
    Abstract: A device for high accurate measurement of time intervals is based on the conversion of the time interval to a sequence of samples of the response of a surface acoustic wave filter excited at the beginning and at the end of the measured interval. In one of its configurations, the time interval measurement device includes the input of the pulse signal, the filter exciter, the surface acoustic wave filter, the amplifier, the sampler, the analog-to-digital converter, the sample registers, the register of sample numbers, the voltage comparator, the control circuits, the sample counter, the computer, the output of the reference clock signal source, and the output of the measured time intervals.
    Type: Application
    Filed: August 20, 2004
    Publication date: March 10, 2005
    Inventor: Petr Panek