Abstract: In accordance with an exemplary embodiment of the present invention, a method is provided to form an image using an active pixel sensor imager (108). The method includes placing an active pixel sensor (202) in electrical contact with a column readout line (204), lacing a sample-and-hold capacitor into electrical contact with the column readout line, and placing the sample-and-hold capacitor (314 or 320) in electrical contact with an input capacitor (324 or 334) on an amplifier (222). All of the input capacitor (324 or 334), the sample-and-hold capacitor (314 or 320), and the active pixel sensor (202) are in electrical contact for an overlapping period of time. A differential output (228) from the amplifier (222) is digitized, and used to form an image.

Abstract: A CMOS image sensor allows for selectively outputting one of two vertical resolutions, e.g. 1080 to 720 lines. The scan conversion is implemented completely on the image sensor chip by using smaller sub-pixel cores, which can be electrically combined via switch transistors. A basic circuit of the CMOS image sensor has a number of pixel cells arranged in lines and columns. Each pixel cell has a photosensitive element that converts impinging light into electric charge and a first transfer element. The first transfer elements of m pixel cells arranged consecutively in the same column are arranged for transferring the charge generated in the respective m photosensitive elements during exposure to a single first charge storage element provided for the respective group of m pixel cells. In an exemplary embodiment the switching scheme allows for combining the signal information of either two or three vertically adjacent sub-pixel cores.

Abstract: A method for driving a sensor comprises, during a first time interval, generating a first type sensor value by repeatedly generating alternating periods of sensitivity and insensitivity of at least one pixel of the sensor, and reading out the sensor, and during a second time interval, generating a second type sensor value by irradiating the scene facing the sensor with pulses of electromagnetic energy having a wavelength detectable by the sensor and having predefined start times and durations, and repeatedly generating alternating periods of sensitivity and insensitivity of the at least one pixel, and reading out the pixel once again. Generating alternating periods of sensitivity and insensitivity includes repeatedly controlling transfer means and reset means of the at least one pixel to alternately enable charge transfer while removing reset from the detector element and to disable charge transfer while resetting the detector element, respectively.

Abstract: Image sensor, which comprises a plurality of pixels arranged as a pixel array with rows and columns and at least one read-out arrangement for reading out the pixels row by row. The columns are grouped into blocks with a certain number N of columns. Each read-out arrangement comprises N column read out circuits and an addressing circuit for with at least two groups of addressing lines for addressing the blocks. The blocks are selectively addressed by the groups of addressing lines in a way that a read-out sequence of blocks addressed by the groups is continuous across all blocks.

Abstract: In accordance with an exemplary embodiment of the present invention, a method is provided to form an image using an active pixel sensor imager (108). The method includes placing an active pixel sensor (202) in electrical contact with a column readout line (204), placing a sample-and-hold capacitor into electrical contact with the column readout line, and placing the sample-and-hold capacitor (314 or 320) in electrical contact with an input capacitor (324 or 334) on an amplifier (222). All of the input capacitor (324 or 334), the sample-and-hold capacitor (314 or 320), and the active pixel sensor (202) are in electrical contact for an overlapping period of time. A differential output (228) from the amplifier (222) is digitized, and used to form an image.

Abstract: A circuit for resetting and reading out a pixel cell of a CMOS image sensor is proposed. The circuit allows for reading out the pixel cell at least two times during a main integration interval, thereby generating at least two pixel signals. The circuit further comprises means for combining the at least two pixel signals to an output signal. The means for combining are operable to combine the at least two pixel signals weighted in dependence on a saturation level of the pixel cell. A method for controlling the circuit for reading out the image sensor is also proposed.

Abstract: An image sensor circuit comprises a pixel cell array having a plurality of pixel cells arranged along a plurality of column lines, a plurality of readout circuits connected to said column lines, each of which comprises an analog-to-digital converter and a multiplexer for selectively applying an output signal of one of said column lines to said analog-to-digital converter. Between two of said column lines which are connected to a first one of said readout circuits located at a first side of said pixel cell array, there is a column line which is connected to a second one of said readout circuits located at a second side of said pixel cell array opposite to said first side.

Abstract: An image sensor circuit comprises at least one pixel cell for providing an output signal which is variable according to illumination of said pixel cell between a maximum and a minimum level, an analogue-to-digital converter for converting output signals from said pixel cell into digital data, and an offset signal source for providing an offset signal having a level between said maximum and minimum levels. The analogue-to-digital converter is fully differential and is connected to said pixel cell and to said offset signal source.

Abstract: A CMOS image sensor allows for selectively outputting one of two vertical resolutions, e.g. 1080 to 720 lines. The scan conversion is implemented completely on the image sensor chip by using smaller sub-pixel cores, which can be electrically combined via switch transistors. A basic circuit of the CMOS image sensor has a number of pixel cells arranged in lines and columns. Each pixel cell has a photosensitive element that converts impinging light into electric charge and a first transfer element. The first transfer elements of m pixel cells arranged consecutively in the same column are arranged for transferring the charge generated in the respective m photosensitive elements during exposure to a single first charge storage element provided for the respective group of m pixel cells. In an exemplary embodiment the switching scheme allows for combining the signal information of either two or three vertically adjacent sub-pixel cores.

Abstract: An image sensor circuit comprises at least one pixel cell for providing an output signal which is variable according to illumination of said pixel cell between a maximum and a minimum level, an analogue-to-digital converter for converting output signals from said pixel cell into digital data, and an offset signal source for providing an offset signal having a level between said maximum and minimum levels. The analogue-to-digital converter is fully differential and is connected to said pixel cell and to said offset signal source.

Abstract: A circuit for resetting and reading out a pixel cell of a CMOS image sensor is proposed. The circuit allows for reading out the pixel cell at least two times during a main integration interval, thereby generating at least two pixel signals. The circuit further comprises means for combining the at least two pixel signals to an output signal. The means for combining are operable to combine the at least two pixel signals weighted in dependence on a saturation level of the pixel cell. A method for controlling the circuit for reading out the image sensor is also proposed.

Abstract: An image sensor circuit comprises a pixel cell array having a plurality of pixel cells arranged along a plurality of column lines, a plurality of readout circuits connected to said column lines, each of which comprises an analog-to-digital converter and a multiplexer for selectively applying an output signal of one of said column lines to said analog-to-digital converter. Between two of said column lines which are connected to a first one of said readout circuits located at a first side of said pixel cell array, there is a column line which is connected to a second one of said readout circuits located at a second side of said pixel cell array opposite to said first side.

Abstract: Image sensor, which comprises a plurality of pixels arranged as a pixel array with rows and columns and at least one read-out arrangement for reading out the pixels row by row. The columns are grouped into blocks with a certain number N of columns. Each read-out arrangement comprises N column read out circuits and an addressing circuit for with at least two groups of addressing lines for addressing the blocks. The blocks are selectively addressed by the groups of addressing lines in a way that a read-out sequence of blocks addressed by the groups is continuous across all blocks.

Abstract: An image sensing device has an image cell with a photo-sensitive element, a detection node and an output pin. Charges accumulated during a first period of time are transferred from the photo-sensitive element to the detection node, thereby obtaining a first voltage, and kept on the detection node which is thus used as a memory. Some moments later, a first value corresponding to the first voltage is generated on the output pin, charges accumulated during a second period of time are transferred from the photo-sensitive element to the detection node, thereby obtaining a second voltage, and a second value is generated on the output pin corresponding to the second voltage. The signal thus generated is also proposed.

Abstract: An image pickup device has an image sensor generating an image signal, a pulse pattern generator generating a driving signal for the image sensor and an amplifier for amplifying the image signal with a given gain, which can be adjusted by the user. The power of the driving signal is controlled depending on the gain. For instance, the pulse height of the driving signal is set depending on the gain.

Abstract: An image pickup device has an image sensor generating an image signal, a pulse pattern generator generating a driving signal for the image sensor and an amplifier for amplifying the image signal with a given gain, which can be adjusted by the user.

Abstract: Front-ends for CCD cameras are known which use a clamping part and a sampling part using parallel arrangement of a coil and a resistor. As coils are almost always bulky they can not be integrated.

Abstract: Image sensors are known in the art and are for example used in cameras to collect the image.