Abstract: Techniques are disclosed to provide guided natural language interactions with a connected data system, such as a graph database. In various embodiments, natural language input associated with a graph database query associated with a graph data set is received. The natural language input is processed to generate a set of candidate strings. At least a subset of the candidate strings is mapped to an entity in the graph data set. The entity and data comprising the graph data are used set to determine a candidate graph pattern associated with the graph database query. The candidate graph pattern is used to guide a user associated with the natural language input to refine the graph database query.

Abstract: Techniques are disclosed to provide guided natural language interactions with a connected data system, such as a graph database. In various embodiments, natural language input associated with a graph database query associated with a graph data set is received. The natural language input is processed to generate a set of candidate strings. At least a subset of the candidate strings is mapped to an entity in the graph data set. The entity and data comprising the graph data are used set to determine a candidate graph pattern associated with the graph database query. The candidate graph pattern is used to guide a user associated with the natural language input to refine the graph database query.

Abstract: Techniques are disclosed to provide guided natural language interactions with a connected data system, such as a graph database. In various embodiments, natural language input associated with a graph database query associated with a graph data set is received. The natural language input is processed to generate a set of candidate strings. At least a subset of the candidate strings is mapped to an entity in the graph data set. The entity and data comprising the graph data are used set to determine a candidate graph pattern associated with the graph database query. The candidate graph pattern is used to guide a user associated with the natural language input to refine the graph database query.

Abstract: An example test system includes a tray to hold devices, where the devices include devices to be tested or devices that have been tested; a motor that is controllable to cause vibrations; and a component that couples the motor to the tray to cause the tray to vibrate in response to the vibrations of the motor.

Abstract: Techniques are disclosed to provide guided natural language interactions with a connected data system, such as a graph database. In various embodiments, natural language input associated with a graph database query associated with a graph data set is received. The natural language input is processed to generate a set of candidate strings. At least a subset of the candidate strings is mapped to an entity in the graph data set. The entity and data comprising the graph data are used set to determine a candidate graph pattern associated with the graph database query. The candidate graph pattern is used to guide a user associated with the natural language input to refine the graph database query.

Abstract: An example test system includes a carrier having a test socket to receive a device to test. The test socket includes electrical connections. The test system also includes a lid assembly having a socket cap to contact the device to apply pressure to cause the device to connect electrically to the electrical connections. The socket cap includes a material having a thermal conductivity that exceeds a defined value. The lid assembly also includes one or more structures configured to provide surface area over which heat from the device dissipates. The one or more structures are made of a material having a thermal conductivity that exceeds the defined value.

Abstract: An example test system includes robotics configured to operate on devices at a first level of precision, and stages configured to operate at levels of precision that are less than the first level of precision. Each of the stages may include parallel paths that are configured to pass the devices between adjacent stages.

Abstract: An example test system includes a tray to hold devices, where the devices include devices to be tested or devices that have been tested; a motor that is controllable to cause vibrations; and a component that couples the motor to the tray to cause the tray to vibrate in response to the vibrations of the motor.

Abstract: An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.

Abstract: An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.

Abstract: A device, according to one embodiment, includes a fuse, and a resistor electrically coupled directly to the fuse in series therewith. A hybrid device, according to another embodiment, includes a fuse, and a resistor electrically coupled directly to the fuse in series therewith in a single package. A resistance of the resistor is 1 ohm or less, and is substantially temperature insensitive.

Abstract: An example test system includes a carrier having a test socket to receive a device to test. The test socket includes electrical connections. The test system also includes a lid assembly having a socket cap to contact the device to apply pressure to cause the device to connect electrically to the electrical connections. The socket cap includes a material having a thermal conductivity that exceeds a defined value. The lid assembly also includes one or more structures configured to provide surface area over which heat from the device dissipates. The one or more structures are made of a material having a thermal conductivity that exceeds the defined value.

Abstract: An example test system includes: a test slot to hold a device under test (DUT); a temperature control system comprising a phase-change material, with the temperature control system for maintaining a temperature of the phase-change material in a steady-state condition, with the phase-change material changing phase during a transient condition to affect a temperature of a thermally-conductive structure, and with the steady-state condition being longer in duration than the transient condition; and an air mover to direct air over the thermally-conductive structure and towards the DUT in the test slot in order to affect a temperature of the DUT.

Abstract: An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.

Abstract: An example test system includes robotics configured to operate on devices at a first level of precision, and stages configured to operate at levels of precision that are less than the first level of precision. Each of the stages may include parallel paths that are configured to pass the devices between adjacent stages.

Abstract: An example test system includes: a test rack including test slots; first and second shuttles that are configured to move contemporaneously to transport devices towards and away from trays, with at least some of the devices having been tested and at least some of the devices to be tested; first and second robots that are configured to move contemporaneously to move the devices that have been tested from test sockets in test carriers to the first and second shuttles, and to move the devices to be tested from the first and second shuttles to the test sockets in test carriers; and first and second test arms that are configured to move contemporaneously to move the test carriers between the first and second robots and the test rack.

Abstract: A differential transmission line includes a positive conductor on which a positive complementary component of a differential signal is transmitted, and a negative conductor parallel to the positive conductor on which a negative complementary component of the differential signal is transmitted. A quarter wavelength differential coupler is inserted along a length of the positive and negative conductors. The quarter wavelength differential coupler has a length corresponding to a frequency of common mode noise on the positive and negative conductors. The quarter wavelength differential coupler reduces the common mode noise at the frequency as the differential signal passes through the quarter wavelength differential coupler.

Abstract: An example test system includes: a test slot to hold a device under test (DUT); a temperature control system comprising a phase-change material, with the temperature control system for maintaining a temperature of the phase-change material in a steady-state condition, with the phase-change material changing phase during a transient condition to affect a temperature of a thermally-conductive structure, and with the steady-state condition being longer in duration than the transient condition; and an air mover to direct air over the thermally-conductive structure and towards the DUT in the test slot in order to affect a temperature of the DUT.

Abstract: Methods of conducting database transactions. One such method comprises receiving data to be written to a database; identifying a set of shard replicas corresponding to the database to which the data is to be written; transmitting, to each of the replicas in the set, a request to write the data thereto; receiving votes back from the replicas in the set, each vote representing whether the respective replica commits to a writing of the data thereto; determining whether to commit to the writing of the data to the database according to whether a majority of the replicas of every shard having replicas in the set has transmitted a vote committing to the writing of the data thereto; and transmitting an outcome of the determining to each of the replicas in the set.