Patents by Inventor Philip Duggan

Philip Duggan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7952695
    Abstract: A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.
    Type: Grant
    Filed: November 4, 2010
    Date of Patent: May 31, 2011
    Assignee: JDS Uniphase Corporation
    Inventors: Douglas E. Crafts, Jinxi Shen, Philip Duggan, James F. Farrell, Barthelemy Fondeur, Eliseo Ranalli
  • Publication number: 20110096326
    Abstract: A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.
    Type: Application
    Filed: November 4, 2010
    Publication date: April 28, 2011
    Applicant: JDS Uniphase Corporation
    Inventors: Douglas E. Crafts, Jinxi Shen, Philip Duggan, James F. Farrell, Barthelemy Fondeur, Eliseo Ranalli
  • Patent number: 7872735
    Abstract: A method and an apparatus for calibrating a MEMS actuator of a hybrid MEMS-PLC optical switch or router is described. Two calibrating waveguides, embedded monolithically adjacent to the waveguides that provide the PLC output functions, are used for referencing a MEMS mirror tilt angle by maximizing optical coupling of light, reflected off the MEMS mirror, into one or each of the two calibrating waveguides. The input light is provided by either a waveguide carrying a live optical signal, or by a special input waveguide, coupled to an LED, for providing a calibrating light. Two emitting waveguides, embedded monolithically adjacent to the waveguides that provide the PLC input functions, can be used.
    Type: Grant
    Filed: June 30, 2008
    Date of Patent: January 18, 2011
    Assignee: JDS Uniphase Corporation
    Inventors: Philip Duggan, Jinxi Shen, Douglas E. Crafts
  • Patent number: 7865079
    Abstract: The invention relates to a compensator of attenuation drift in an optical multi-wavelength switch (MWS) which uses input signal amplitude dither and external VOA dither cancellation to determine relative position of MEMS micro mirror hence indirectly determining attenuation level.
    Type: Grant
    Filed: October 29, 2007
    Date of Patent: January 4, 2011
    Assignee: JDS Uniphase Corporation
    Inventors: Philip Duggan, Krassimir Stoev
  • Patent number: 7852475
    Abstract: A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.
    Type: Grant
    Filed: August 12, 2008
    Date of Patent: December 14, 2010
    Assignee: JDS Uniphase Corporation
    Inventors: Douglas E. Crafts, Jinxi Shen, Philip Duggan, James F. Farrell, Barthelemy Fondeur, Eliseo Ranalli
  • Publication number: 20090046288
    Abstract: A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.
    Type: Application
    Filed: August 12, 2008
    Publication date: February 19, 2009
    Applicant: JDS Uniphase Corporation
    Inventors: Douglas E. Crafts, Jinxi Shen, Philip Duggan, James F. Farrell, Barthelemy Fondeur, Eliseo Ranalli
  • Publication number: 20090009752
    Abstract: A method and an apparatus for calibrating a MEMS actuator of a hybrid MEMS-PLC optical switch or router is described. Two calibrating waveguides, embedded monolithically adjacent to the waveguides that provide the PLC output functions, are used for referencing a MEMS mirror tilt angle by maximizing optical coupling of light, reflected off the MEMS mirror, into one or each of the two calibrating waveguides. The input light is provided by either a waveguide carrying a live optical signal, or by a special input waveguide, coupled to an LED, for providing a calibrating light. Two emitting waveguides, embedded monolithically adjacent to the waveguides that provide the PLC input functions, can be used.
    Type: Application
    Filed: June 30, 2008
    Publication date: January 8, 2009
    Applicant: JDS Uniphase Corporation
    Inventors: Philip Duggan, Jinxi Shen, Douglas E. Crafts
  • Publication number: 20080101743
    Abstract: The invention relates to a compensator of attenuation drift in an optical multi-wavelength switch (MWS) which uses input signal amplitude dither and external VOA dither cancellation to determine relative position of MEMS micro mirror hence indirectly determining attenuation level.
    Type: Application
    Filed: October 29, 2007
    Publication date: May 1, 2008
    Inventors: Philip Duggan, Krassimir Stoev
  • Patent number: 7359053
    Abstract: An array of optical elements for processing a spatially dispersed optical beam including monitoring optical elements for determining the position of the optical beam in the array is disclosed. The monitoring optical elements have a width that varies in ay direction normal to the array axis, enabling the determination of the beam position across the monitoring elements in both x and y directions. The monitoring optical elements are preferably disposed in the end portions of the array for the beam tilt determination. The optical elements can be e.g. liquid crystal pixels or micro-mirrors.
    Type: Grant
    Filed: March 1, 2005
    Date of Patent: April 15, 2008
    Assignee: JDS Uniphase Inc.
    Inventors: Steven Harold Moffat, Stephen Robert de Hennin, Martin Matthews, David William Charles Markin, Philip Duggan
  • Publication number: 20050286393
    Abstract: An array of optical elements for processing a spatially dispersed optical beam including monitoring optical elements for determining the position of the optical beam in the array is disclosed. The monitoring optical elements have a width that varies in ay direction normal to the array axis, enabling the determination of the beam position across the monitoring elements in both x and y directions. The monitoring optical elements are preferably disposed in the end portions of the array for the beam tilt determination. The optical elements can be e.g. liquid crystal pixels or micro-mirrors.
    Type: Application
    Filed: March 1, 2005
    Publication date: December 29, 2005
    Inventors: Steven Moffat, Stephen de Hennin, Martin Matthews, David Markin, Philip Duggan
  • Patent number: 6915030
    Abstract: An optical spectrum analyzer for analyzing at least n wavelengths of light is disclosed having a tunable filter with an input port and an output port and a periodic output response with a free spectral range FSR and having a bandwidth B. An AWG is optically coupled to receive light from the output port; and for distributing the light spatially at other locations in a wavelength dependent manner. Optically coupled with the AWG are m detectors for detecting wavelength or channel information. The number of detectors, m is less than n when a single detector is associated with a single channel; and m is less than 2n when two detectors are associated with a single channel.
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: July 5, 2005
    Inventors: Mikelis Nils Svilans, Philip Duggan, Paul Colbourne
  • Publication number: 20040096151
    Abstract: An optical spectrum analyzer for analyzing at least n wavelengths of light is disclosed having a tunable filter with an input port and an output port and a periodic output response with a free spectral range FSR and having a bandwidth B. An AWG is optically coupled to receive light from the output port; and for distributing the light spatially at other locations in a wavelength dependent manner. Optically coupled with the AWG are m detectors for detecting wavelength or channel information. The number of detectors, m is less than n when a single detector is associated with a single channel; and m is less than 2n when two detectors are associated with a single channel.
    Type: Application
    Filed: November 13, 2003
    Publication date: May 20, 2004
    Inventors: Mikelis Nils Svilans, Philip Duggan, Paul Colbourne
  • Patent number: 6490801
    Abstract: Sun sensors or position sensors may be used to determine the angular location of the sun or other object with respect to the sensor. The sun sensor provides high resolution over a wide field of regard. A position or sun sensor comprises a sensor housing, a plurality of pinholes formed In the sensor housing, a detector mounted within the housing and a method of processing the information detected. The detector is mounted in the sensor housing. Each pinhole has a field of view and the detector receives the images from each field of view. Each field of view is defined by the position of the pinhole relative to the detector. The images are received in an overlay relationship thereby providing a field of regard. The processing method determines the presence and location of an object In a field of regard.
    Type: Grant
    Filed: November 17, 2000
    Date of Patent: December 10, 2002
    Assignee: Centre for Research in Earth and Space Technology
    Inventors: Charles H. Hersom, Philip Duggan, William A. Gault