Abstract: The present disclosure relates to a system and method for mapping system transfer functions. Accordingly, some operations may include receiving a first intermediate signal that is at least partially based upon a first reference signal. A second intermediate signal is received that is at least partially based upon a second reference signal. An output signal is generated that is based upon the difference between the first intermediate signal and the second intermediate signal. A first anticipated differential change in the output signal is determined, the first anticipated differential change to occur based upon a transition in the first reference signal. A second anticipated differential change in the output signal is determined, the second anticipated differential change to occur based upon a transition in the second reference signal. Numerous other operations are also within the scope of the present disclosure.

Abstract: A method, circuit, and computer program product for receiving a first intermediate signal that is at least partially based upon a first reference signal. A second intermediate signal is received that is at least partially based upon a second reference signal. An output signal is generated that is based upon the difference between the first intermediate signal and the second intermediate signal. A first anticipated differential change in the output signal is determined, the first anticipated differential change to occur based upon a transition in the first reference signal. A second anticipated differential change in the output signal is determined, the second anticipated differential change to occur based upon a transition in the second reference signal. A first realized differential change in the output signal is measured, the first realized differential change occurring based upon a transition in the first reference signal.

Abstract: A mixed signal integrated circuit testing system includes a system controller connected to a test head for controlling the testing operations of the mixed signal integrated circuit testing system. The test head is adapted to support a wide combination of both the analog and digital circuit testing modules. A DUT board, typically configured for a specific IC or family of ICs, is used to connect the circuit testing modules to the IC. The DUT board is connected to a DUT board interface that includes an analog DUT board interface adapter and a digital DUT board interface adapter. The digital DUT board interface adapter is connected directly to the digital circuit testing modules. The analog DUT board interface adapter is connected to a system configuration module that provides analog loading and conditioning circuitry as well as other circuitry that can be customized for testing specific ICs.