Patents by Inventor Philip F. S. Swab

Philip F. S. Swab has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11502249
    Abstract: A re-writeable non-volatile memory device including a re-writeable non-volatile two-terminal memory element (ME) having tantalum. The ME including a first terminal, a second terminal, a first layer of a conductive metal oxide (CMO), and a second layer in direct contact with the first layer. The second layer and the first layer being operative to store at least one-bit of data as a plurality of resistive states, and the first and second layer are electrically in series with each other and with the first and second terminals.
    Type: Grant
    Filed: September 22, 2020
    Date of Patent: November 15, 2022
    Assignee: Hefei Reliance Memory Limited
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 10833125
    Abstract: A re-writeable non-volatile memory device including a re-writeable non-volatile two-terminal memory element (ME) having tantalum. The ME including a first terminal, a second terminal, a first layer of a conductive metal oxide (CMO), and a second layer in direct contact with the first layer. The second layer and the first layer being operative to store at least one-bit of data as a plurality of resistive states, and the first and second layer are electrically in series with each other and with the first and second terminals.
    Type: Grant
    Filed: May 14, 2019
    Date of Patent: November 10, 2020
    Assignee: Hefei Reliance Memory Limited
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 10797106
    Abstract: A re-writeable non-volatile memory device including a re-writeable non-volatile two-terminal memory element (ME) having tantalum. The ME including a first terminal, a second terminal, a first layer of a conductive metal oxide (CMO), and a second layer in direct contact with the first layer. The second layer and the first layer being operative to store at least one-bit of data as a plurality of resistive states, and the first and second layer are electrically in series with each other and with the first and second terminals.
    Type: Grant
    Filed: May 14, 2019
    Date of Patent: October 6, 2020
    Assignee: Hefei Reliance Memory Limited
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 10340312
    Abstract: A re-writeable non-volatile memory device including a re-writeable non-volatile two-terminal memory element (ME) having tantalum. The ME including a first terminal, a second terminal, a first layer of a conductive metal oxide (CMO), and a second layer in direct contact with the first layer. The second layer and the first layer being operative to store at least one-bit of data as a plurality of resistive states, and the first and second layer are electrically in series with each other and with the first and second terminals.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: July 2, 2019
    Assignee: Hefei Reliance Memory Limited
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 9806130
    Abstract: A re-writeable non-volatile memory device including a re-writeable non-volatile two-terminal memory element (ME) having tantalum. The ME including a first terminal, a second terminal, a first layer of a conductive metal oxide (CMO), and a second layer in direct contact with the first layer. The second layer and the first layer being operative to store at least one-bit of data as a plurality of resistive states, and the first and second layer are electrically in series with each other and with the first and second terminals.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: October 31, 2017
    Assignee: Unity Semiconductor Corporation
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 9570515
    Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3-LSCoO or LaNiO3-LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.
    Type: Grant
    Filed: September 10, 2015
    Date of Patent: February 14, 2017
    Assignee: UNITY SEMICONDUCTOR CORPORATION
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Patent number: 9570165
    Abstract: A memory device includes an array of resistive memory cells. Each resistive memory cell in the array includes a first resistive memory element, a second resistive memory element, and a two-terminal switching element. The first resistive memory element is electrically coupled to the second resistive memory element and to the switching element at a common node.
    Type: Grant
    Filed: December 11, 2014
    Date of Patent: February 14, 2017
    Assignee: Rambus Inc.
    Inventors: Deepak Chandra Sekar, Gary Bela Bronner, Christophe J. Chevallier, Lidia Vereen, Philip F. S. Swab, Elizabeth Friend, Mehmet Gunhan Ertosun
  • Patent number: 9159408
    Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3-LSCoO or LaNiO3-LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.
    Type: Grant
    Filed: January 29, 2014
    Date of Patent: October 13, 2015
    Assignee: UNITY SEMICONDUCTOR CORPORATION
    Inventors: Christophe J. Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Philip F. S. Swab, Edmond R. Ward
  • Publication number: 20120064691
    Abstract: A treated conductive element is provided. A conductive element can be treated by depositing either a reactive metal or a very thin layer of material on the conductive element. The reactive metal (or very thin layer of material) would typically be sandwiched between the conductive element and an electrode. The structure additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays.
    Type: Application
    Filed: November 21, 2011
    Publication date: March 15, 2012
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventors: DARRELL RINERSON, WAYNE KINNEY, EDMOND R. WARD, STEVE KUO-REN HSIA, STEVEN W. LONGCOR, CHRISTOPHE J. CHEVALLIER, JOHN SANCHEZ, PHILIP F. S. SWAB
  • Publication number: 20120033481
    Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3—LSCoO or LaNiO3—LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.
    Type: Application
    Filed: October 13, 2011
    Publication date: February 9, 2012
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventors: DARRELL RINERSON, WAYNE KINNEY, EDMOND R. WARD, STEVE KUO-REN HSIA, STEVEN LONGCOR, CHRISTOPHE J. CHEVALLIER, JOHN SANCHEZ, PHILIP F. S. SWAB
  • Publication number: 20090045390
    Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3—LSCoO or LaNiO3—LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.
    Type: Application
    Filed: October 1, 2008
    Publication date: February 19, 2009
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventors: Darrel Rinerson, Wayne Kinney, Edmond R. Ward, Steve Kuo-Ren Hsia, Steven W. Longcor, Christophe J. Chevallier, John Sanchez, Philip F. S. Swab
  • Patent number: 6972985
    Abstract: A memory including a memory element having islands is provided. The memory has address decoding circuitry and an array of memory plugs. The memory plugs include memory element that have island structures of a first material within the bulk of a second material. The island structures are typically nanoparticles. The memory plugs can be placed in a first resistive state at a first write voltage, placed in a second resistive state at a second write voltage, and have its resistive state determined at a read voltage.
    Type: Grant
    Filed: June 15, 2004
    Date of Patent: December 6, 2005
    Inventors: Darrell Rinerson, Christophe J. Chevallier, Philip F. S. Swab, Steve Kuo-Ren Hsia, John E. Sanchez, Jr., Steven W. Longcor