Patents by Inventor Philip G. Stein

Philip G. Stein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring misalignment between superimposed patterns
    Patent number: 4750836
    Abstract: A first pattern of circular indicia of the same diameter and of equal spacing is superimposed with an overlapping second pattern of circular indicia of the same diameter as the first pattern indicia. The indicia of the second pattern are in progressively larger spacings in mirror image relation to a central reference indicia. Measurement indicia are adjacent to each indicia of the second pattern. Observation of the most closely aligned indicia of the first and second patterns and the measurement indicia corresponding to that most closely aligned indicia gives a quick visual measurement of the magnitude of the misalignment.
    Type: Grant
    Filed: September 18, 1986
    Date of Patent: June 14, 1988
    Assignee: RCA Corporation
    Inventor: Philip G. Stein