Abstract: A memory chip suitable for use in a daisy chain of memory chips. The memory chip receives an address/command word on a first input, determines if the address command word is directed to the memory chip; if so, the memory chip accesses an array on the memory chip. If not, the memory chip re-drives the address/command word on a first output. Write data is received as part of the address/command word or from a first data bus port. A bus clock is received and is used to receive and transmit information on the first input, the first output, the first data bus port and the second data bus port. The memory chip is incorporated into a design structure that is embodied in a computer readable medium used for designing, manufacturing, or testing the memory chip.

Abstract: A double-data-rate two synchronous dynamic random access (DDR2) memory circuit includes a low-speed input path and a high-speed input path coupled thereto by an input coupling and forming a common input, the common input coupled to a memory core, the memory core having a common output wherein a high-speed output path and a low-speed output path are coupled together by an output coupling and further coupled to the common output of the memory core.

Abstract: A power control method and power control structures are provided for managing a plurality of voltage islands of a functional chip. The power control structure includes a supply control and partition chip positioned between a substrate carrier and a functional chip including a plurality of voltage islands. The supply control and partition chip includes a plurality of first electrical connections to the functional chip including the plurality of voltage islands. The supply control and partition chip includes a plurality of second electrical connections to the substrate carrier. Power applied to predefined ones of the first electrical connections to the functional chip are selectively switched on and off by the supply control and partition chip.

Abstract: A stacking method and structure for attaching memory components to a ball grid array (BGA) device are provided. A specialized carrier includes multiple memory devices such as memory die, or chip scale packaging (CSP) memory. The specialized carrier is attached to a mating supporting carrier to form a stacked structure. The mating supporting carrier includes an associated ball grid array (BGA) device for the multiple devices of the specialized carrier.

Abstract: A method and apparatus are provided for identifying product tampering. A mechanical fastening screw, a sleeve and a movable follower disk are arranged to show evidence of tampering. The movable follower disk is received within a cavity defined by the sleeve. The sleeve includes a channel and a final resting slot defined within a sleeve wall. The movable follower disk includes compressible spring followers slideably received within the channel when the mechanical fastening screw is inserted. If the screw is removed, the compressible spring followers engage the final resting slot to indicate tampering. Electrical detection of the compressible spring followers engaging the final resting slot is used to identify tampering.

Abstract: A method, apparatus and computer program product are provided for implementing vertically coupled noise control through a mesh plane in an electronic package design. Electronic package physical design data are received. Instances of vertically coupled noise in the electronic package physical design data are identified. The identified instances of vertically coupled noise are quantified. Then the electronic package physical design data are modified to limit the vertically coupled noise.

Abstract: A method and structure are provided for creating printed circuit boards with stepped thickness. A non-laminating breakaway material layer is selectively placed between layers of the printed circuit board. A perimeter portion of the printed circuit board near the breakaway material layer is scored. Then the breakaway material layer and adjacent layers between the perimeter of the printed circuit board are removed.

Abstract: A method and apparatus are provided for implementing direct attenuation loss measurement in an electronic package. A sinusoidal voltage source signal of a selected frequency is coupled to an embedded transmission line test structure in the electronic package. Receive circuitry is coupled to the transmission line test structure for detecting amplitude of a received sinusoidal voltage source signal to identify attenuation loss through the transmission line test structure. An identified attenuation loss of the transmission line test structure is compared with a threshold value for verifying acceptable attenuation of the electronic package transmission line test structure.

Abstract: A method and stiffener-embedded waveguide structure are provided for implementing enhanced data transfer for printed circuit board applications. At least one microwave channel is defined within a stiffener. The microwave channel provides a high frequency path for data transfers. Use of the waveguide channel in the stiffener for data transfers can replace or supplement otherwise required transmission paths in an associated printed circuit board.

Abstract: A method and structure are provided for implementing enhanced electronic packaging and printed circuit board (PCB) layout. A diagonal via is formed at a selected angle between a first side and an opposite second side of a printed circuit board at a selected printed circuit board location. The diagonal via is plated with an electrically conductive material. Diagonal vias are used to interconnect between a high-density pitch on the first side and a larger pitch on the opposite second side of the printed circuit board. The diagonal vias can be used to selectively interconnect electrical patterns of selected layers and eliminate the use of blind and buried vias.

Abstract: A method and apparatus are provided for implementing automated electronic package transmission line characteristic impedance verification. A sinusoidal voltage source is coupled to a transmission line test structure for generating a selected frequency. Impedance measuring circuitry is coupled to the transmission line test structure for measuring an input impedance with an open-circuit termination and a short-circuit termination. Characteristic impedance calculation circuitry is coupled to the impedance measuring circuitry receiving the input impedance measured values for the open-circuit termination and the short-circuit termination for calculating characteristic impedance. Logic circuitry is coupled to the characteristic impedance calculation circuitry for comparing the calculated characteristic impedance with threshold values for verifying acceptable electronic package transmission line characteristic impedance.

Abstract: A method and structure are provided for implementing a column attach coupled noise suppressor for a solder column structure of the type used to join a substrate to a circuit card. The electrical noise suppressor structure includes a plurality of elongated through openings that are arranged in a predefined pattern. The elongated through openings have electrically conductive sidewalls and are electrically connected together. The predefined pattern of the elongated, electrically conductive through openings corresponds to a layout of solder columns. The solder columns are attached at one end to either a substrate or a circuit card and are inserted through the elongated through openings of the electrical noise suppressor structure, spaced apart from the electrically conductive sidewalls. Then the solder columns are attached at the other end to the other one of the substrate or circuit card.

Abstract: A method and a probe structure are provided for implementing multiple signals probing of a printed circuit board. A probe structure is formed on an outside surface of the printed circuit board. A resistor is electrically connected with an associated via with a signal to be monitored. A path to a predefined probe location for monitoring the signal is defined from the resistor using the probe structure.