Patents by Inventor Philip M. Remes

Philip M. Remes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140332694
    Abstract: A method of making an ion optics component includes providing an electrically isolating substrate and machining away material of the substrate from at least one major surface thereof to form features of a first electrode sub-assembly. The formed features include a first surface for supporting integration of a first electrode body and a second surface for supporting integration of a second electrode body. Subsequent plating and masking steps result in the formation of a first electrode body on the first surface and a second electrode body on the second surface. A bridge is integrally formed in the electrically isolating material, so as to electrically isolate the first electrode body from the second electrode body.
    Type: Application
    Filed: May 13, 2013
    Publication date: November 13, 2014
    Inventors: Viatcheslav V. KOVTOUN, Andrew W. SCHIRMER, Syed F. RIZVI, Philip M. REMES
  • Publication number: 20140306107
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising performing a survey mass analysis using a mass analyzer to measure a flux of ions having m/z ratios within said restricted range and performing a dependent mass analysis of an optimal quantity of ions having m/z ratios within said restricted range, said optimal quantity collected for a time period determined by the measured ion flux, CHARACTERIZED IN THAT: the time period is determined using a corrected ion flux that accounts for one or more of: (a) imperfect restriction of collected ions to the range of m/z ratios, (b) inclusion of ions within the range of m/z ratios that are undetected by the survey mass analysis, (c) different mass analyzers used for the dependent and survey mass analyses, and (d) different ion pathways used during dependent and the survey mass analyses.
    Type: Application
    Filed: April 11, 2014
    Publication date: October 16, 2014
    Applicant: Thermo Finnigan LLC
    Inventors: Philip M. REMES, Michael W. SENKO
  • Publication number: 20140264007
    Abstract: A method is described for identifying the occurrence and location of charging of ion optic devices arranged along the ion path of a mass spectrometer. The method includes repeatedly performing a sequence of introducing a beam of discharge ions to a location on the ion path, and subsequently measuring the intensities of opposite-polarity sample ions delivered to a mass analyzer, with the discharge ions being delivered to a location further downstream in the ion path at each successive sequence.
    Type: Application
    Filed: March 17, 2014
    Publication date: September 18, 2014
    Applicant: THERMO FINNIGAN LLC
    Inventors: Philip M. REMES, Michael W. SENKO, Michael W. BELFORD, Jae C. SCHWARTZ, Jean-Jacques DUNYACH, Berg TEHLIRIAN
  • Patent number: 8785847
    Abstract: A mass spectrometer having an ion guide with an axial field is described. The ion guide includes electrodes with longitudinally extending gaps and inserts configured to be proximate to the gaps.
    Type: Grant
    Filed: February 15, 2012
    Date of Patent: July 22, 2014
    Assignee: Thermo Finnigan LLC
    Inventors: Viatcheslav V. Kovtoun, Philip M. Remes, Yevgeniy N. Zhuk
  • Patent number: 8759752
    Abstract: A method for determining a mass-to-charge ratio of an analyte is described that accounts for space charge limitations when there are relatively high concentrations of ions in an ion trap. The method includes calibrating a mass spectrometer for the space charge effects caused by the analyte ion itself and also for adjacent ions that have a mass-to-charge ratio different than the analyte ion. A mass spectrum can be measured for both an analyte ion and an adjacent ion where there is a relatively high concentration of ions in the ion trap. A corrected mass-to-charge ratio can be calculated for an analyte ion based on the measured analyte mass-to-charge ratio, the measured analyte abundance, the first mass-to-charge ratio difference, and the measured first adjacent ion abundance. The resulting corrected mass-to-charge ratio has an increased accuracy and at the same time improves the dynamic range of the ion trap mass analyzer.
    Type: Grant
    Filed: March 12, 2012
    Date of Patent: June 24, 2014
    Assignee: Thermo Finnigan LLC
    Inventor: Philip M. Remes
  • Publication number: 20130234014
    Abstract: A method for determining a mass-to-charge ratio of an analyte is described that accounts for space charge limitations when there are relatively high concentrations of ions in an ion trap. The method includes calibrating a mass spectrometer for the space charge effects caused by the analyte ion itself and also for adjacent ions that have a mass-to-charge ratio different than the analyte ion. A mass spectrum can be measured for both an analyte ion and an adjacent ion where there is a relatively high concentration of ions in the ion trap. A corrected mass-to-charge ratio can be calculated for an analyte ion based on the measured analyte mass-to-charge ratio, the measured analyte abundance, the first mass-to-charge ratio difference, and the measured first adjacent ion abundance. The resulting corrected mass-to-charge ratio has an increased accuracy and at the same time improves the dynamic range of the ion trap mass analyzer.
    Type: Application
    Filed: March 12, 2012
    Publication date: September 12, 2013
    Inventor: Philip M. REMES
  • Publication number: 20130206973
    Abstract: A mass spectrometer having an ion guide with an axial field is described. The ion guide includes electrodes with longitudinally extending gaps and inserts configured to be proximate to the gaps.
    Type: Application
    Filed: February 15, 2012
    Publication date: August 15, 2013
    Inventors: Viatcheslav V. KOVTOUN, Philip M. Remes, Yevgeniy N. Zhuk
  • Patent number: 8384022
    Abstract: A method of calibrating an ion trap having electrodes to which main RF trapping and resonant ejection voltages are applied comprises: identifying, for each of a plurality of ion types having different respective mass-to-charge ratios, an optimum resonant ejection voltage amplitude at which a mass peak quality is optimized when the ion trap mass analyzer is operated at a selected scan rate; determining a best-fit function of the form Vreseject=mc(a+bm), where Vreseject and m represent resonant ejection voltage amplitude and mass-to-charge ratio and a, b and c are constants; identifying, for each of a plurality of ion types, a respective RF voltage amplitude at which ions of each respective type are ejected from the ion trap using a resonant ejection voltage calculated according to the best-fit function; and determining a second best-fit function relating the identified trapping voltage amplitudes to mass-to-charge; ratio.
    Type: Grant
    Filed: October 31, 2011
    Date of Patent: February 26, 2013
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Jae C. Schwartz
  • Patent number: 8278620
    Abstract: A method of calibrating ion collision energy used in a mass spectrometer, comprises: (a) obtaining fragment ion yield data for each of a plurality of precursor ion populations having respective mass-to-charge ratios at each of a plurality of settings of a fragmentation-energy-related variable; (b) locating, for each mass-to-charge ratio, reference values of the fragmentation-energy-related variable, each reference value corresponding to a respective reference feature of the ion yield data at the mass-to-charge ratio; (c) determining, from the plurality of locating steps, the variation, with mass-to-charge-ratio, of each of the reference values of the fragmentation-energy-related variable; (d) associating each of the reference values of the fragmentation-energy related variable with respective reference values of a dimensionless useable-fragmentation-energy variable; and (e) storing parameters describing the variation of each of the reference values of the fragmentation-energy-related variable with mass-to-cha
    Type: Grant
    Filed: May 3, 2010
    Date of Patent: October 2, 2012
    Assignee: Thermo Finnigan LLC
    Inventors: Jae C. Schwartz, Philip M. Remes
  • Patent number: 8258462
    Abstract: A method for calibrating an ion trap mass spectrometer is disclosed. The method includes establishing an optimal phase and amplitude-m/z relationship by acquiring peak quality data at varying values of amplitude and phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
    Type: Grant
    Filed: September 27, 2010
    Date of Patent: September 4, 2012
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Jae C. Schwartz
  • Patent number: 8178835
    Abstract: A technique is disclosed for conducting collision induced dissociation (CID) in a quadrupole ion trap (QIT) having higher order field components. In order to compensate for the shift in the frequency of motion with amplitude of the excited ions arising from the influence of higher-order field components, the amplitude of the RF voltages applied to the QIT is monotonically varied during the excitation period to prolong the condition of resonance, resulting in higher average kinetic energies of the excited ions. Thus, higher fragmentation efficiencies may be obtained, or a targeted level of fragmentation may be achieved in less time relative to conventional CID.
    Type: Grant
    Filed: November 17, 2009
    Date of Patent: May 15, 2012
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Jae C. Schwartz
  • Publication number: 20110266426
    Abstract: A method of calibrating ion collision energy used in a mass spectrometer, comprises: (a) obtaining fragment ion yield data for each of a plurality of precursor ion populations having respective mass-to-charge ratios at each of a plurality of settings of a fragmentation-energy-related variable; (b) locating, for each mass-to-charge ratio, reference values of the fragmentation-energy-related variable, each reference value corresponding to a respective reference feature of the ion yield data at the mass-to-charge ratio; (c) determining, from the plurality of locating steps, the variation, with mass-to-charge-ratio, of each of the reference values of the fragmentation-energy-related variable; (d) associating each of the reference values of the fragmentation-energy related variable with respective reference values of a dimensionless useable-fragmentation-energy variable; and (e) storing parameters describing the variation of each of the reference values of the fragmentation-energy-related variable with mass-to-cha
    Type: Application
    Filed: May 3, 2010
    Publication date: November 3, 2011
    Inventors: Jae C. SCHWARTZ, Philip M. Remes
  • Publication number: 20110012013
    Abstract: A method for calibrating an ion trap mass spectrometer is disclosed. The method includes establishing an optimal phase and amplitude-m/z relationship by acquiring peak quality data at varying values of amplitude and phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
    Type: Application
    Filed: September 27, 2010
    Publication date: January 20, 2011
    Inventors: Philip M. REMES, Jae C. Schwartz
  • Publication number: 20100282963
    Abstract: A technique is disclosed for conducting collision induced dissociation (CID) in a quadrupole ion trap (QIT) having higher order field components. In order to compensate for the shift in the frequency of motion with amplitude of the excited ions arising from the influence of higher-order field components, the amplitude of the RF voltages applied to the QIT is monotonically varied during the excitation period to prolong the condition of resonance, resulting in higher average kinetic energies of the excited ions. Thus, higher fragmentation efficiencies may be obtained, or a targeted level of fragmentation may be achieved in less time relative to conventional CID.
    Type: Application
    Filed: November 17, 2009
    Publication date: November 11, 2010
    Inventors: Philip M. REMES, Jae C. SCHWARTZ
  • Patent number: 7804065
    Abstract: A method for calibrating an ion trap mass spectrometer is disclosed. The method includes steps of identifying a phase (defined by the RF trapping and resonant ejection voltages) that optimizes peak characteristics, and then determining, for each of a plurality of calibrant ions, an optimal resonant ejection voltage amplitude when the ion trap is operated at the identified phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: September 28, 2010
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Jae C. Schwartz
  • Publication number: 20100059666
    Abstract: A method for calibrating an ion trap mass spectrometer is disclosed. The method includes steps of identifying a phase (defined by the RF trapping and resonant ejection voltages) that optimizes peak characteristics, and then determining, for each of a plurality of calibrant ions, an optimal resonant ejection voltage amplitude when the ion trap is operated at the identified phase. The resonant ejection voltage applied to the electrodes of the ion trap may then be controlled during analytical scans in accordance with the established relationship between m/z and resonant ejection voltage amplitude.
    Type: Application
    Filed: September 5, 2008
    Publication date: March 11, 2010
    Inventors: Philip M. Remes, Jae C. Schwartz