Abstract: A method of separating a sample of ions according to their ion mobilities is provided. The method comprises receiving the sample of ions into a drift tube; applying a first electric field component within the drift tube so as to cause the sample of ions to move along a path within the drift tube, whereby the sample of ions separates along the path; and applying a second electric field component within the drift tube. The first and second electric field components have a combined electric field strength to modify the ion mobility of at least a portion of the sample of ions and to increase the separation of at least a portion of the sample of ions along the path The second electric field component substantially does not cause a net change in the velocity of the sample of ions perpendicular to the path. An apparatus for separating a sample of ions according to their ion mobilities is also provided.

Abstract: The present invention provides a pump device 50 which is usable to dilute a sample 52 before analysis. A first pump 54 pumps the sample to a mixing region 58 where it mixes with a diluent 66. A second pump 64 pumps the diluted sample to the analysis instrument. The flow of the diluent to the mixer is equal to the difference of the flow of the sample to the mixer and the flow of the diluted sample to the instrument. Pumps 54 and 64 are independently controllable by a controller unit which is arranged so that data from the instrument can be used to determine the dilution factor of the sample. Thus, the controller can control this dilution factor in real time, upon receipt of such data from the instrument, by change either one of (or both) the pump's flow rate.

Abstract: The present invention provides a pump device 50 which is usable to dilute a sample 52 before analysis. A first pump 54 pumps the sample to a mixing region 58 where it mixes with a diluent 66. A second pump 64 pumps the diluted sample to the analysis instrument. The flow of the diluent to the mixer is equal to the difference of the flow of the sample to the mixer and the flow of the diluted sample to the instrument. Pumps 54 and 64 are independently controllable by a controller unit which is arranged so that data from the instrument can be used to determine the dilution factor of the sample. Thus, the controller can control this dilution factor in real time, upon receipt of such data from the instrument, by change either one of (or both) the pump's flow rate.

Abstract: The present invention provides a pump device 50 which is usable to dilute a sample 52 before analysis. A first pump 54 pumps the sample to a mixing region 58 where it mixes with a diluent 66. A second pump 64 pumps the diluted sample to the analysis instrument. The flow of the diluent to the mixer is equal to the difference of the flow of the sample to the mixer and the flow of the diluted sample to the instrument. Pumps 54 and 64 are independently controllable by a controller unit which is arranged so that data from the instrument can be used to determine the dilution factor of the sample. Thus, the controller can control this dilution factor in real time, upon receipt of such data from the instrument, by change either one of (or both) the pump's flow rate.

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artifact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artifact ions in the collision cell (24).

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artifact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artifact ions in the collision cell (24).

Abstract: An inductively coupled plasma alignment apparatus having a coil 10 for generating an inductively coupled plasma in a gas, the coil having a first axis 100; a torch 20 passing at least partially through the coil, the torch having a second axis 200; and an adjustment mechanism 80, 110 for adjusting the position of the torch with respect to the coil so as to alter the relative configuration of the first and second axes. The adjustment mechanism may adjust an angle and/or a distance between the second axis and the first axis. The second axis may be held substantially parallel to the first axis, while the adjustment mechanism adjusts a distance between the second axis and the first axis. The coil is preferably maintained substantially fixed in position with respect to a sampling aperture for sampling photons or ions from the plasma.

Abstract: An assembly for can manufacture includes a toolpack having coolant dies (3,4,5,6) adjacent and either side of ironing dies (1,2) so that coolant may be circulated around cavities in the coolant dies so as to cool the ironing die inserts (12). Generally, the toolpack is used in conjunction with a ram (20), coolant tube assembly (30) and ram guidance assembly (60) which together ensure that the ram is cooled along its entire length, up to and including the punch nose (21).

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).

Abstract: A reclosable metal container in the style of a bottle-shaped can has a conventional can body of steel or aluminum to which a metal neck component is seamed. A sleeve of plastics fits over the neck component and a detent inside the sleeve clips it onto the seam. The upper edge of the sleeve is fixed in place by a curl on the upper edge of the neck component. By using a separate neck component and hiding the seam under a sleeve, conventional sizes and material gauges can be used for the can body. Thicker material may be used for the neck component in order to withstand necking forces. Threads for closing the container may be provided either on the sleeve or, in an embodiment where the sleeve is simply used to cover the seam, on a cylindrical part of the neck component itself.

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artifact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or reformation, of unwanted artifact ions in the collision cell (24).

Abstract: A mass filter apparatus for filtering a beam of ions is described. The apparatus comprises an ion beam source and first and second mass filter stages in series to receive the ion beam. A vacuum system maintains the first and second filter stages at substantially the same operating pressure, below 10?3 torr. The first mass filter stage transmits only ions having a sub-range of mass-to-charge ratios including a selected mass-to-charge ratio. The second filter transmits only ions of the selected mass-to-charge ratio. The second mass filter can achieve high accuracy detection without being subjected to problems such as build-up of material on quadrupole rods, resulting in a distorted electric field close to the rods. The first mass filter acts as a coarse filter, typically transmitting 1% of ions received from the ion source. Thus, the detection accuracy and lifetime of mass spectrometers embodying this invention are greatly improved.

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (5) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).

Abstract: An inductively coupled plasma alignment apparatus having a coil 10 for generating an inductively coupled plasma in a gas, the coil having a first axis 100; a torch 20 passing at least partially through the coil, the torch having a second axis 200; and an adjustment mechanism 80, 110 for adjusting the position of the torch with respect to the coil so as to alter the relative configuration of the first and second axes. The adjustment mechanism may adjust an angle and/or a distance between the second axis and the first axis. The second axis may be held substantially parallel to the first axis, while the adjustment mechanism adjusts a distance between the second axis and the first axis. The coil is preferably maintained substantially fixed in position with respect to a sampling aperture for sampling photons or ions from the plasma.

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).

Abstract: The present invention provides a pump device 50 which is usable to dilute a sample 52 before analysis. A first pump 54 pumps the sample to a mixing region 58 where it mixes with a diluent 66. A second pump 64 pumps the diluted sample to the analysis instrument. The flow of the diluent to the mixer is equal to the difference of the flow of the sample to the mixer and the flow of the diluted sample to the instrument. Pumps 54 and 64 are independently controllable by a controller unit which is arranged so that data from the instrument can be used to determine the dilution factor of the sample. Thus, the controller can control this dilution factor in real time, upon receipt of such data from the instrument, by change either one of (or both) the pump's flow rate.

Abstract: A pumping apparatus (50) which isolates a sample (52) from a pump (72), thereby circumventing the so-called “memory effect” problem. The sample is pumped into an intermediary, or buffer region (64) using a first pump (54). The sample is displaced from this buffer region by pumping a second fluid (74) into the buffer region using a second pump (72). When the sample is displaced from the buffer region it proceeds to a mixer (78) where it can be diluted before analysis. The second pump is required to operate with a high degree of accuracy so that the sample is diluted by a consistent amount. Preferably, the second pump is a highly accurate piston pump.

Abstract: A mass filter apparatus for filtering a beam of ions is described. The apparatus comprises an ion beam source and first and second mass filter stages in series to receive the ion beam. A vacuum system maintains the first and second filter stages at substantially the same operating pressure, below 10?3 torr. The first mass filter stage transmits only ions having a sub-range of mass-to-charge ratios including a selected mass-to-charge ratio. The second filter transmits only ions of the selected mass-to-charge ratio. The second mass filter can achieve high accuracy detection without being subjected to problems such as build-up of material on quadrupole rods, resulting in a distorted electric field close to the rods. The first mass filter acts as a coarse filter, typically transmitting 1% of ions received from the ion source. Thus, the detection accuracy and lifetime of mass spectrometers embodying this invention are greatly improved.

Abstract: The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (5) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).

Abstract: A mass filter apparatus for filtering a beam of ions is described. The apparatus comprises an ion beam source and first and second mass filter stages in series to receive the ion beam. A vacuum system maintains the first and second filter stages at substantially the same operating pressure, below 10?3 torr. The first mass filter stage transmits only ions having a sub-range of mass-to-charge ratios including a selected mass-to-charge ratio. The second filter transmits only ions of the selected mass-to-charge ratio. The second mass filter can achieve high accuracy detection without being subjected to problems such as build-up of material on quadrupole rods, resulting in a distorted electric field close to the rods. The first mass filter acts as a coarse filter, typically transmitting 1% of ions received from the ion source. Thus, the detection accuracy and lifetime of mass spectrometers embodying this invention are greatly improved. A mass filter apparatus for filtering a beam of ions is described.