Patents by Inventor Philip Michael Chovanec

Philip Michael Chovanec has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11313660
    Abstract: In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.
    Type: Grant
    Filed: March 30, 2020
    Date of Patent: April 26, 2022
    Assignee: Lockheed Martin Corporation
    Inventors: Jonathan Richard Olson, Tyler Martin Rup, Philip Michael Chovanec, Matthew Timothy McKee, Alondra Renee Guevara, Carl Bargainer, Glynn Bartlett, Thomas E. Lyons, Jr., J. Mark Major, Ryan McBee, Paul Wood, Stephen L. Wiedmann
  • Publication number: 20210302145
    Abstract: In an embodiment, an apparatus includes one or more probes, a tip, a pin, and a measurement device. The one or more probes may be configured for insertion through an aperture in a component. The tip may be slidably engaged with the one or more probes and include a first end configured to contact a first surface of the component. The first end of the tip may be conically shaped. The pin may be slidably engaged with the one or more probes and include a first end configured for insertion into the aperture in the component such that the one or more probes are configured to contact a second surface of the component. The pin may be configured to move between a first position and a second position. An axis of the pin may be substantially aligned with an axis of the tip. The measurement device may be coupled to the tip and configured to measure a value indicating a grip length.
    Type: Application
    Filed: March 30, 2020
    Publication date: September 30, 2021
    Inventors: Jonathan Richard Olson, Tyler Martin Rup, Philip Michael Chovanec, Matthew Timothy McKee, Alondra Renee Guevara, Carl Bargainer, Glynn Bartlett, Thomas E. Lyons, JR., J. Mark Major, Ryan McBee, Paul Wood, Stephen L. Wiedmann
  • Patent number: 10330453
    Abstract: An apparatus comprises a pin, a stop, a spring, one or more flanges, a measurement device, and a transmitter. The pin comprises a first end configured for insertion in an aperture in a component. The stop is slidably engaged with the pin and configured to contact a first surface of the component as the pin is inserted into the aperture in the component. The spring couples the stop to the housing. The one or more flanges are located proximate to the first end of the pin. The one or more flanges are configured to contact a second surface of the component. The measurement device is coupled to the pin. The transmitter is communicatively coupled to the measurement device.
    Type: Grant
    Filed: March 29, 2017
    Date of Patent: June 25, 2019
    Assignee: Lockheed Martin Corporation
    Inventors: Tyler Martin Rup, Philip Michael Chovanec
  • Publication number: 20180283841
    Abstract: An apparatus comprises a pin, a stop, a spring, one or more flanges, a measurement device, and a transmitter. The pin comprises a first end configured for insertion in an aperture in a component. The stop is slidably engaged with the pin and configured to contact a first surface of the component as the pin is inserted into the aperture in the component. The spring couples the stop to the housing. The one or more flanges are located proximate to the first end of the pin. The one or more flanges are configured to contact a second surface of the component. The measurement device is coupled to the pin. The transmitter is communicatively coupled to the measurement device.
    Type: Application
    Filed: March 29, 2017
    Publication date: October 4, 2018
    Inventors: Tyler Martin Rup, Philip Michael Chovanec