Abstract: Power distribution networks (PDNs) using hybrid grid and pillar arrangements are disclosed. In particular, a process for designing an integrated circuit (IC) considers various design criteria when placing and routing the PDN for the IC. Exemplary design criteria include switching frequencies, current densities, and decoupling capacitance and their impact on temperature. In areas of high localized temperature, a power grid structure is used. In other areas, shared metal track pillars may be used. By mixing power grids with pillars, the IC may reduce local hotspots by allowing the grid to help dissipate heat and assist with decoupling capacitance while at the same time providing pillars in areas of high current density to reduce resistive losses.

Abstract: Power distribution networks (PDNs) using hybrid grid and pillar arrangements are disclosed. In particular, a process for designing an integrated circuit (IC) considers various design criteria when placing and routing the PDN for the IC. Exemplary design criteria include switching frequencies, current densities, and decoupling capacitance and their impact on temperature. In areas of high localized temperature, a power grid structure is used. In other areas, shared metal track pillars may be used. By mixing power grids with pillars, the IC may reduce local hotspots by allowing the grid to help dissipate heat and assist with decoupling capacitance while at the same time providing pillars in areas of high current density to reduce resistive losses.

Abstract: Complementary metal oxide semiconductor (MOS) (CMOS) standard cell circuits employing metal lines in a first metal layer used for routing, and related methods are disclosed. In one aspect, a CMOS standard cell circuit includes first supply rail, second supply rail, and metal lines disposed in the first metal layer. One or more of the metal lines are dynamically cut corresponding to a first cell boundary and a second cell boundary of the CMOS standard cell such that the metal lines have cut edges corresponding to the first and second cell boundaries. Metal lines not cut corresponding to the first and second cell boundaries can be used to interconnect nodes of the CMOS standard cell circuit. Dynamically cutting the metal lines allows the first metal layer to be used for routing, reducing routing in other metal layers such that fewer vias and metal lines are disposed above the first metal layer.