Patents by Inventor Philip Neaves
Philip Neaves has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20200163562Abstract: An apparatus is provided for monitoring heart rate. The apparatus comprises various components to effectively reduce photodiode capacitance. The apparatus includes: an amplifier; a first current source; a first pair of resistors coupled to the first current source and the amplifier; a pair of devices coupled to the first pair of resistors; a photo-diode coupled to the pair of devices; a second pair of resistors coupled to the pair of devices and the photo-diode; and a second current source coupled to the second pair of resistors.Type: ApplicationFiled: August 13, 2018Publication date: May 28, 2020Applicant: Intel CorporationInventor: Philip Neaves
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Patent number: 8049331Abstract: A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.Type: GrantFiled: July 22, 2010Date of Patent: November 1, 2011Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Publication number: 20100283158Abstract: A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.Type: ApplicationFiled: July 22, 2010Publication date: November 11, 2010Applicant: Micron Technology, Inc.Inventor: PHILIP NEAVES
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Patent number: 7763497Abstract: A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.Type: GrantFiled: November 25, 2008Date of Patent: July 27, 2010Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Patent number: 7612816Abstract: A comparator with an input stage that selectively powers up an output stage provides an electronic device with a comparator that operates at low power. In an embodiment, an input stage produces a near decision and a true decision, where the near decision is provided to power up an output stage for the comparator to provide an output representative of the true decision.Type: GrantFiled: May 26, 2004Date of Patent: November 3, 2009Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Publication number: 20090072389Abstract: A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.Type: ApplicationFiled: November 25, 2008Publication date: March 19, 2009Applicant: Micron Technology, Inc.Inventor: Philip Neaves
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Patent number: 7477306Abstract: A bias readout circuit is disclosed for use in reading out a pixel of an imager system. The bias readout circuit includes a circuit portion which mirrors an output and bias transistor of a pixel to amplify an output signal produced by a pixel and increase the dynamic range of the pixel output.Type: GrantFiled: August 27, 2004Date of Patent: January 13, 2009Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Patent number: 7462935Abstract: A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.Type: GrantFiled: February 13, 2004Date of Patent: December 9, 2008Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Patent number: 7352201Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: March 8, 2006Date of Patent: April 1, 2008Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Patent number: 7276928Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: March 8, 2006Date of Patent: October 2, 2007Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Patent number: 7274205Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: March 8, 2006Date of Patent: September 25, 2007Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Patent number: 7274204Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: March 8, 2006Date of Patent: September 25, 2007Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Patent number: 7183790Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: May 26, 2005Date of Patent: February 27, 2007Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Patent number: 7164260Abstract: A CMOS bandgap reference (BGR) voltage generator circuit has a passive resistor T-network of low resistance connected between the inverting and non-inverting inputs of the op-amp in the circuit. The op-amp's output is connected to the gates of three PMOS transistors and the drains of two of the transistors are connected in a looped manner to the input terminals of the op-amp. The T-network is placed between these drains that connect to the op-amp. Becuse of the rules governing abstracts, this abstract should not be used to construe the claims.Type: GrantFiled: November 17, 2005Date of Patent: January 16, 2007Assignee: Micron Technology, Inc.Inventor: Philip Neaves
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Patent number: 7112980Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: GrantFiled: October 21, 2003Date of Patent: September 26, 2006Assignee: Micron Technology, Inc.Inventors: Philip Neaves, Andrew Lever
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Publication number: 20060181301Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: ApplicationFiled: March 8, 2006Publication date: August 17, 2006Inventors: Philip Neaves, Andrew Lever
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Publication number: 20060170446Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: ApplicationFiled: March 8, 2006Publication date: August 3, 2006Inventors: Philip Neaves, Andrew Lever
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Publication number: 20060152244Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: ApplicationFiled: March 8, 2006Publication date: July 13, 2006Inventors: Philip Neaves, Andrew Lever
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Publication number: 20060152243Abstract: An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.Type: ApplicationFiled: March 8, 2006Publication date: July 13, 2006Inventors: Philip Neaves, Andrew Lever
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Patent number: 7075330Abstract: A signal balancing circuit for capacitively coupled signaling between transmitting and receiving devices over a plurality of capacitively coupled signal lines on which data signals are transmitted from the transmitting device to the receiving device. The signal balancing circuit includes an encode circuit for forcing a signal transition of a data signal for a data interval in response to the data signal maintaining the same logic state throughout a respective time interval. A balancing signal is generated having a logic level and a timing relative to the time intervals of the respective data signals indicative of inversion of a particular data signal. A decode circuit coupled to the encode circuit to receive the balancing signal forces a transition of the transitioned signal at the appropriate time in accordance with the balance signal to recover the original logic level of the data signal.Type: GrantFiled: July 29, 2005Date of Patent: July 11, 2006Assignee: Micron Technology, Inc.Inventor: Philip Neaves