Abstract: A stage for an infrared spectroscope has a focusing body and a sampling element spaced apart by a mounting fixture. The focusing body and sampling element optically cooperate by transmission and internal refraction and reflection to focus an infrared beam on a sample surface and to collect the beam for analysis after it was reflected from the sample surface. The sampling element is made of a durable material and can be removably mounted in the fixture.

Abstract: An internal reflection element for a Fourier transform infrared spectrometer employs a single lens providing refraction and internal reflection of an infrared beam so as to focus the beam on a centrally located sample surface and to collect and focus radiation reflected from this sample surface for analysis.

Abstract: A twin-arm interferometer spectrometer having a tiltable reflector assembly, which includes a pair of mutually facing parallel reflective elements, varies the path length of both interferometer arms simultaneously to achieve high resolution in a small, low maintenance design. Collimated electromagnetic radiation is split by a beamsplitter into first and second arm beams. Both arm beams impinge on the tiltable reflector assembly, to retroreflectors, and back to the beamsplitter wherein they recombine to form an exit beam. The exit beam is directed to a sample and then to a suitable detector. Modulation of the exit beam is produced by tilting the reflector assembly about an axis parallel to the reflective elements in the reflector assembly. This tilting causes a simultaneous variation in the path length of both interferometer arms, and thereby yields a large total path difference with a relatively small movement.

Abstract: A specular reflection analyzer uses opposed parabolic mirror sections to direct a focussed beam at an angle of incidence against a sample surface and to receive a reflected beam at a corresponding angle of reflection. A first collimated beam of light is directed at a constant angle against the first parabolic mirror from a beam diverter movable parallel to the mirror's axis of symmetry and within the first collimated beam of light. Translation of the constant angle beam along a meridian on the surface of the first parabolic mirror changes the angle of incidence of a beam focused on the sample without changing the focal point. The light reflected from the sample is received in a corresponding manner by the second parabolic mirror and transformed into a collimated beam of constant angle to be received by a second beam diverter tracking the first beam diverter. Transfer optics may be used to adapt the apparatus for use in a conventional transmission spectrometer.

Abstract: A twin-arm interferometer spectrometer having a tiltable reflector assembly, which includes a pair of mutually facing parallel reflective elements, varies the path length of both interferometer arms simultaneously to achieve high resolution in a small, low maintenance design. Collimated electromagnetic radiation is split by a beamsplitter into first and second arm beams. Both arm beams impinge on the tiltable reflector assembly, to retroreflectors, and back to the beamsplitter wherein they recombine to form an exit beam. The exit beam is directed to a sample and then to a suitable detector. Modulation of the exit beam is produced by tilting the reflector assembly about an axis parallel to the reflective elements in the reflector assembly. This tilting causes a simultaneous variation in the path length of both interferometer arms, and thereby yields a large total path difference with a relatively small movement.

Abstract: An analytical instrument includes an optical system having a source of incoming radiation (11) which in a transmission test is focused by a primary focusing element (15) onto a sample (16). The radiation transmitted through the sample is collimate by a focusing-collimating element (20) and directed across the beam of incoming radiation (14) before focused on a detector (12). To perform a test of the reflectance of the sample, an intercept element (28) is moved into position in the incoming beam (14) to deflect a portion (36) of the beam which is directed to the focusing-collimating element (20) and focused on the sample. The reflected radiation from the sample is collected by the focusing-collimating element (20) into a collimated beam (38) that is parallel and adjacent to the incoming beam, and which is directed in a path which passes by the intercept element (28) to be focused onto the detector (12).

Abstract: An infrared spectroscopy instrument includes a housing having a sample chamber which is sized and shaped to accommodate the body of an automatic feeding slide projector of the type commonly utilized with standard photographic slide transparencies. The infrared beam is reflected by a system of mirrors into a beam path which extends through a portion of the slide projector mechanism ordinarily occupied by the projector lamp and optics, which have been removed. Samples are held in special sample holders adapted in size and shape to fit the compartments utilized in the slide magazine of the projector. These sample holders are indexed one at a time under the control of the instrument into a viewing position in the path of the infrared beam, and the beam passed through the sample is then collected and focused onto a detector.