Patents by Inventor Philip R. Rigg

Philip R. Rigg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5530550
    Abstract: The position detector has a sensitivity characteristic graded along a direction transverse to the surface, so that the output of the position detector is used to determine a height of the surface. A surface height detection and positioning device for use in a surface inspection system. An incident beam of light impinges obliquely upon the surface, and a position detector is disposed to receive specularly reflected light, producing a plurality of electrical signals, with a mechanical window, defining an aperture, placed in front of the detector. The aperture's width, along the scan direction, is of sufficient size so as to create a train of signals from each of the plurality of electrical signals, having a frequency equal to the scan frequency. These electrical signals carry information responsive to both the position of reflected beam impinging on the detector and the beam's intensity and are, in turn, related to a height of the surface.
    Type: Grant
    Filed: December 21, 1994
    Date of Patent: June 25, 1996
    Assignee: Tencor Instruments
    Inventors: Mehrdad Nikoonahad, Philip R. Rigg, Keith B. Wells, David S. Calhoun
  • Patent number: 5493116
    Abstract: Improved techniques for imaging high-aspect-ratio structures such as contact holes utilize two signal detection sub-systems, one optimized for imaging at the top and another optimized for imaging at the base of submicrometer structures. These detection systems produce signals that can be combined in real-time to produce an image which resembles the "extended focus" images obtained with confocal optical microscopes. Unlike the confocal image, however, the resulting image has the inherent linearity and resolution characteristics of electron-beam technology. Using the new approach, the signal, rather than exhibiting a near-zero minimum at the base of the structure as is typical of the prior art, exhibits its maximum at the base of the structure, allowing high-precision measurement with no need for extrapolation.
    Type: Grant
    Filed: October 26, 1993
    Date of Patent: February 20, 1996
    Assignee: Metrologix, Inc.
    Inventors: Guillermo L. Toro-Lira, Alan H. Achilles, Nolan V. Frederick, Kevin M. Monahan, Philip R. Rigg
  • Patent number: 5173776
    Abstract: An apparatus and method for continuously improving the signal-to-noise ratio of a stationary video image by digital integration, without the loss of signal amplitude incurred by conventional designs. The apparatus includes a sampling analog-to-digital converter for digitizing an input video signal frame which is supplied to a calculating device along with a preceding video signal frame supplied from the output of the calculating device through a memory device. These features, in conjunction with other digital logic components, form a digital recusive filter. The calculating device sums new and previously stored data for each pixel in amounts scaled to counteract the loss of signal range that occurs as the random-noise component averages to zero. By appropriate selection of operating parameters, the method can be used to maintain or even boost the amplitude of a video signal while simultaneously enhancing its signal-to-noise ratio.
    Type: Grant
    Filed: June 6, 1990
    Date of Patent: December 22, 1992
    Assignee: ElectroScan Corporation
    Inventors: Philip R. Rigg, Neil Baumgarten
  • Patent number: 4922196
    Abstract: An electron-beam scanning device (10) includes two pairs of plates (22 and 24, 64 and 66) that are oriented at right angles to each other. The plates cause electric fields oriented at right angles in a deflection region (68) through which an electron beam passes. Each pair of plates comprises the inner conductor and one of the outer conductors of a stripline section that conducts a deflection signal. The stripline section is matched in characteristic impedance to the coaxial cable by which the deflection signal is transmitted to the plates. A stop plate (28) ordinarily prevents the electron beam from reaching its target (30) but has an aperture (26) into which the beam can be momentarily deflected to cause a pulse of beam current to hit the target (30).
    Type: Grant
    Filed: April 19, 1989
    Date of Patent: May 1, 1990
    Assignee: Amray, Inc.
    Inventor: Philip R. Rigg