Abstract: A dual analyser mass spectrometer obtains MS1/MS2 scans of positive and negative ions by: operating an ion source and processing region at a first polarity; performing, by a first mass analyser (FMA) at the first polarity, MS1 or MS2 scan(s); switching polarity of the FMA to a second polarity; performing, by a second mass analyser (SMA) at the first polarity, MS1 or MS2 scan(s), wherein at least part of the MS1 or MS2 scan(s) performed by the SMA is performed while the FMA is switching polarity. Alternatively, the FMA may be operated at a first polarity and the SMA at a second polarity opposite to the first, and after initiating at least one MS1 scan and/or MS2 scan by the FMA, switching the polarity of the source and ion processing region to a second polarity and performing at least one MS1 scan and/or MS2 scan with the SMA.

Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor. The first resistor is configured to define the first voltage, the first resistor having a first temperature coefficient. The second resistor is configured to define the second voltage, the second resistor having a second temperature coefficient.

Abstract: A Time of Flight (TOF) mass analyser comprises an ion source, a detector, an electrode, and a resistive divider comprising first and second resistors. The ion source and the detector define an ion flight path from the ion source to the detector. The electrode is arranged along the ion flight path and receives an output voltage. Thermal expansion produces a first mass shift/Kelvin of detected ions. The resistive divider is thermally coupled to the TOF mass analyser to receive an input voltage and output an output voltage to the electrode. The first and second resistors have respective first and second temperature coefficients that provide a voltage shift/Kelvin to the output voltage to the electrode producing a second mass shift/Kelvin of detected ions, compensating for the first mass shift/Kelvin.

Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor. The first resistor is configured to define the first voltage, the first resistor having a first temperature coefficient. The second resistor is configured to define the second voltage, the second resistor having a second temperature coefficient.

Abstract: The invention relates to a gas analyzing device (1) which comprises at least one ion mobility spectrometer (2). Said gas analyzing device (1) also comprises an energy supply device (50) interacting with a reaction chamber (5) of the ion mobility spectrometer (2) which is designed to manipulate the density of free reactant ions in the reaction chamber (5) by supplying energy. The invention also relates to a method for analyzing gas by means of a gas analyzing device according to the ion mobility spectrometry.