Patents by Inventor Philipp Frederic Schulz

Philipp Frederic Schulz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for analyzing a sample
    Patent number: 12498327
    Abstract: A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.
    Type: Grant
    Filed: October 4, 2023
    Date of Patent: December 16, 2025
    Assignee: Analytik Jena GmbH+Co. KG
    Inventors: Marcus Großmann, Iouri Kalinitchenko, Wolfram Weisheit, Philipp Frederic Schulz
  • SYSTEM FOR ANALYZING A SAMPLE
    Publication number: 20240118212
    Abstract: A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.
    Type: Application
    Filed: October 4, 2023
    Publication date: April 11, 2024
    Inventors: Marcus Großmann, Iouri Kalinitchenko, Wolfram Weisheit, Philipp Frederic Schulz