Patents by Inventor Philipp Kukura
Philipp Kukura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250093633Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: December 6, 2024Publication date: March 20, 2025Inventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Patent number: 12189105Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: GrantFiled: May 8, 2023Date of Patent: January 7, 2025Assignee: Oxford University Innovation LimitedInventors: Philipp Kukura, Alexander Weigel, Justin Benesch
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Publication number: 20240353325Abstract: A scattering microscopy arrangement uses a microscope to image an object comprising a surface. A light source emits illuminating light and a light detector detects light elastically scattered from the object. An electric potential is applied to the surface that affects the electrochemical properties of the object while imaging. The electric potential provides a contrast mechanism that improves the imaging and allows for characterisation of the object and/or the surrounding environment.Type: ApplicationFiled: July 2, 2024Publication date: October 24, 2024Inventors: Philipp KUKURA, Sanli FAEZ
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Patent number: 12111456Abstract: The application discloses a method and apparatus for imaging a sample by interferometric scattering microscopy, the method comprising illuminating a sample with at least one coherent light source, the sample being held at a sample location comprising an interface having a refractive index change, illuminating the sample with illuminating radiation to generate a backpropagating signal from the sample comprising light reflected at the interface and light scattered by the sample, splitting the backpropagating signal into first and second signals, modifying the second signal using a modifying element such that the second signal differs from the first signal, directing the first and second signals onto first and second detectors to generate, respectively, first and second images and comparing, by a processor, the first and second images to determine one or more characteristics of the sample.Type: GrantFiled: October 9, 2020Date of Patent: October 8, 2024Assignees: Refeyn Ltd, Oxford University Innovation LimitedInventors: Matthias Karl Franz Langhorst, Daniel Richard Cole, David John Lehar Graham, Philipp Kukura, Lee Priest
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Patent number: 12072287Abstract: A scattering microscopy arrangement uses a microscope to image an object comprising a surface. A light source emits illuminating light and a light detector detects light elastically scattered from the object. An electric potential is applied to the surface that affects the electrochemical properties of the object while imaging. The electric potential provides a contrast mechanism that improves the imaging and allows for characterisation of the object and/or the surrounding environment.Type: GrantFiled: March 12, 2020Date of Patent: August 27, 2024Assignee: OXFORD UNIVERSITY INNOVATION LIMITEDInventors: Philipp Kukura, Sanli Faez
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Publication number: 20230359009Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: May 8, 2023Publication date: November 9, 2023Applicant: Oxford University Innovation LimitedInventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Publication number: 20220365329Abstract: The application discloses a method and apparatus for imaging a sample by interferometric scattering microscopy, the method comprising illuminating a sample with at least one coherent light source, the sample being held at a sample location comprising an interface having a refractive index change, illuminating the sample with illuminating radiation to generate a backpropagating signal from the sample comprising light reflected at the interface and light scattered by the sample, splitting the backpropagating signal into first and second signals, modifying the second signal using a modifying element such that the second signal differs from the first signal, directing the first and second signals onto first and second detectors to generate, respectively, first and second images and comparing, by a processor, the first and second images to determine one or more characteristics of the sample.Type: ApplicationFiled: October 9, 2020Publication date: November 17, 2022Inventors: Matthias Karl Franz LANGHORST, Daniel Richard COLE, David John Lehar GRAHAM, Philipp KUKURA, Lee PRIEST
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Publication number: 20220221401Abstract: A scattering microscopy arrangement uses a microscope to image an object comprising a surface. A light source emits illuminating light and a light detector detects light elastically scattered from the object. An electrical potential is applied to the surface that affects the electrochemical properties of the object while imaging The electrical potential provides a contrast mechanism that improves the imaging and allows for characterisation of the object and/or the surrounding environment.Type: ApplicationFiled: March 12, 2020Publication date: July 14, 2022Inventors: Philipp KUKURA, Sanli FAEZ
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Publication number: 20200386975Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: August 13, 2020Publication date: December 10, 2020Inventors: Philipp KUKURA, Alexander WEIGEL, Justin BENESCH
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Publication number: 20200378891Abstract: The invention relates the use of single particle light scattering, preferably interferometric scattering microscopy (also referred to herein as iSCAT), to measure the concentration of a particle in a solution. The invention furthermore relates to the use of light scattering to detect lipoprotein particles in a sample, and to related diagnostic and treatment methods.Type: ApplicationFiled: December 4, 2018Publication date: December 3, 2020Inventors: Joanna ANDRECKA, Philipp KUKURA, Gavin YOUNG, Justin BENESCH
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Patent number: 10775597Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: GrantFiled: August 21, 2018Date of Patent: September 15, 2020Assignee: Oxford University Innovation LimitedInventors: Philipp Kukura, Alexander Weigel, Justin Benesch
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Publication number: 20190004299Abstract: An interferometric scattering microscope is adapted by performing spatial filtering of output light, which comprises both light scattered from a sample location and illuminating light reflected from the sample location, prior to detection of the output light. The spatial filtering passes the reflected illumination light but with a reduction in intensity that is greater within a predetermined numerical aperture than at larger numerical apertures. This enhances the imaging contrast for coherent illumination, particularly for objects that are weak scatterers.Type: ApplicationFiled: August 21, 2018Publication date: January 3, 2019Inventors: Philipp KUKURA, Alexander WEIGEL
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Patent number: 6744500Abstract: Pulp and/or paper samples are scanned with a Laser Raman Spectroscopic probe, utilizing Raman spectroscopic technology, to generate Raman spectroscopic images of all or selected ones of the constituents and/or contaminants contained in the sample, to compare the same with a library of Raman spectroscopic fingerprints of known constituents and/or contaminants, and to identify and communicate data on all or selected ones of the constituents and/or contaminants for purposes of controlling the paper making process and/or determination of the quality of the paper produced.Type: GrantFiled: October 23, 2001Date of Patent: June 1, 2004Assignees: Stora Enso North America Corporation, SpectraCode, Inc.Inventors: James E. Bradbury, Donald R. Smith, Edward R. Grant, Philipp Kukura
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Publication number: 20030076492Abstract: Pulp and/or paper samples are scanned with a Laser Raman Spectroscopic probe, utilizing Raman spectroscopic technology, to generate Raman spectroscopic images of all or selected ones of the constituents and/or contaminants contained in the sample, to compare the same with a library of Raman spectroscopic fingerprints of known constituents and/or contaminants, and to identify and communicate data on all or selected ones of the constituents and/or contaminants for purposes of controlling the paper making process and/or determination of the quality of the paper produced.Type: ApplicationFiled: October 23, 2001Publication date: April 24, 2003Applicant: Stora Enso North America and SpectraCode, Inc.Inventors: James E. Bradbury, Donald R. Smith, Edward R. Grant, Philipp Kukura