Abstract: The disclosure relates to devices for capturing microscopy images of a sample, comprising a partially coherent light source and an image sensor having a sensor head and sensor readout means. The sensor head and light source are arranged such that the sensor head and light source define a sample space therebetween for receiving a substrate having a sample, and such that an optical image of a sample in the sample space by the partially coherent light source onto the sensor head represents an intensity pattern. Further, the disclosure relates to systems for monitoring a sample having a plurality of such devices for capturing microscopy images.

Abstract: A method for investigating one or a plurality of phase objects is described, in which a grid made up of elements is used, which is illuminated with light of a light source, the coherence length of which is larger than the average spacing of adjacent elements of the grid. A diffraction image of the illuminating light scattered on the grid is generated, whereby the one or the plurality of phase objects are placed in the light path between the light source and the grid and/or in the light path of the illuminating light scattered on the grid. At least a part of the diffraction image is detected by an optical sensor directly or after interaction with further optical components and converted into a signal. The signal is analyzed further in order to ascertain information relating to the one or plurality of phase objects therefrom. A corresponding device is likewise described.

Abstract: Shown are a device (26) and a method for detecting the deflection of a plurality of elastic elements (22), wherein the elastic elements (22) can be deflected out of a rest position against a restoring force and are suitable as resonators and/or for measuring a force acting on a respective elastic element (22). The elastic elements (22) are arranged periodically, The arrangement of the elastic elements (22) is illuminated using light, the coherence length of which is larger than the average spacing of adjacent elastic elements (22). A diffraction image is hereby created of the illuminating light scattered on the arrangement of elastic elements (22), and at least a portion of the diffraction image is detected by an optical sensor (32) directly or after interaction with further optical components. The detected image or image signal is subsequently analyzed in order to determine information relating to the deflection state of the elastic elements (22) therefrom.

Abstract: A method for investigating one or a plurality of phase objects is described, in which a grid made up of elements is used, which is illuminated with light of a light source, the coherence length of which is larger than the average spacing of adjacent elements of the grid. A diffraction image of the illuminating light scattered on the grid is generated, whereby the one or the plurality of phase objects are placed in the light path between the light source and the grid and/or in the light path of the illuminating light scattered on the grid. At least a part of the diffraction image is detected by an optical sensor directly or after interaction with further optical components and converted into a signal. The signal is analysed further in order to ascertain information relating to the one or plurality of phase objects therefrom. A corresponding device is likewise described.

Abstract: Shown are a device (26) and a method for detecting the deflection of a plurality of elastic elements (22), wherein the elastic elements (22) can be deflected out of a rest position against a restoring force and are suitable as resonators and/or for measuring a force acting on a respective elastic element (22). The elastic elements (22) are arranged periodically, The arrangement of the elastic elements (22) is illuminated using light, the coherence length of which is larger than the average spacing of adjacent elastic elements (22). A diffraction image is hereby created of the illuminating light scattered on the arrangement of elastic elements (22), and at least a portion of the diffraction image is detected by an optical sensor (32) directly or after interaction with further optical components. The detected image or image signal is subsequently analysed in order to determine information relating to the deflection state of the elastic elements (22) therefrom.