Patents by Inventor Philipp Steuer

Philipp Steuer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10928177
    Abstract: Measuring apparatus for surface or contour measurement on a workpiece has a probe for contacting the surface of workpiece to be measured. Probe has a holding part to which a probe arm is detachably connectable or connected. Measuring apparatus also has a feed apparatus for moving probe relative to workpiece to be measured, and a control apparatus for controlling feed apparatus. A position sensor associated with probe arm and connected to control apparatus is provided, and which detects changes in the position of the probe arm, relative to holding part, from a measuring position into an interference position of probe arm, and generates a position change signal. Control apparatus is designed and programmed in such a way that, as a response to a position change signal, it generates a control signal for controlling feed apparatus in such a way that feed movement of probe is influenced.
    Type: Grant
    Filed: February 12, 2019
    Date of Patent: February 23, 2021
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventors: Philipp Steuer, Wolfgang Speck
  • Patent number: 10760891
    Abstract: Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
    Type: Grant
    Filed: March 27, 2018
    Date of Patent: September 1, 2020
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Philipp Steuer
  • Publication number: 20190249975
    Abstract: Measuring apparatus for surface or contour measurement on a workpiece has a probe for contacting the surface of workpiece to be measured. Probe has a holding part to which a probe arm is detachably connectable or connected. Measuring apparatus also has a feed apparatus for moving probe relative to workpiece to be measured, and a control apparatus for controlling feed apparatus. A position sensor associated with probe arm and connected to control apparatus is provided, and which detects changes in the position of the probe arm, relative to holding part, from a measuring position into an interference position of probe arm, and generates a position change signal. Control apparatus is designed and programmed in such a way that, as a response to a position change signal, it generates a control signal for controlling feed apparatus in such a way that feed movement of probe is influenced.
    Type: Application
    Filed: February 12, 2019
    Publication date: August 15, 2019
    Inventors: Philipp STEUER, Wolfgang SPECK
  • Publication number: 20190101371
    Abstract: Surface measuring apparatus for measuring a surface of a workpiece has a probe including a probe arm bearing a probe element for contacting workpiece surface to be measured. Surface measuring apparatus also has a feed apparatus for moving probe element relative to workpiece to be measured. Probe arm is detachably connectable or connected to a movable part of feed apparatus via a mechanical interface having a first part and a second part, which in installed position of probe arm are connected to one another with static determinacy on movable part of feed apparatus, and one of the parts is associated with probe arm and the other part is associated with feed apparatus. At least one alignment protrusion is on first part as an installation alignment aid, which in installed position of probe arm contactlessly or essentially contactlessly engages in an alignment recess formed on second part.
    Type: Application
    Filed: March 27, 2018
    Publication date: April 4, 2019
    Inventor: Philipp Steuer