Patents by Inventor Philipp Treutlein

Philipp Treutlein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250044333
    Abstract: The present disclosure relates to a sensor system for analyzing a spectrum of an electromagnetic, EM, signal. The system includes a vapor cell containing at least one species of atoms in a gaseous form, wherein the atoms in the vapor cell are exposed to the EM signal; at least one excitation source excites a number of atoms in the vapor cell to a Rydberg state, wherein at least a fraction of the excited atoms are ionized; a number of electrode pairs which are arranged along the vapor cell, and which generate a spatially and/or temporally varying electric field in the vapor cell; a current sense circuit detects a current between at least one of the number of electrode pairs, wherein the current is caused by ionized atoms in the vapor cell; and a processor determines spectral information of the EM signal based on the detected current.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 6, 2025
    Applicants: Rohde & Schwarz GmbH & Co. KG, University Of Basel
    Inventors: Thomas RUSTER, Melvyn HO, Philipp TREUTLEIN, Yongqi SHI
  • Publication number: 20250005711
    Abstract: The present disclosure relates to a sensor system sensing a physical quantity. The system includes an excitation source for generating an excitation signal. A sensing volume includes quantum system(s), wherein the sensing volume is arranged to receive the excitation signal. The excitation signal induces an emission and/or an adaption of an optical signal by the sensing volume. A characteristic(s) of the optical signal depends on the physical quantity. An imaging system applies a transformation to the optical signal, thereby generating a transformed optical signal at an image plane. A spatially dependent attenuator is arranged at the image plane and attenuates the transformed optical signal. An optical sensor captures the thus attenuated optical signal and detects an image formed by the optical signal. A processor extracts an information on the physical quantity from the captured image pattern.
    Type: Application
    Filed: June 30, 2023
    Publication date: January 2, 2025
    Applicants: Rohde & Schwarz GmbH & Co. KG, University of Basel
    Inventors: Thomas RUSTER, Melvyn HO, Philipp TREUTLEIN, Yongqi SHI
  • Publication number: 20240426886
    Abstract: A sensor system for sensing EM radiation and a method for calibrating the system are provided. The system includes a sensing element that receives calibration signals or signal components with different frequencies. Recording device records responses of the sensing element to at least two calibration signals or signal components. A respective response to a calibration signal of the at least two calibration signals or signal components depends on an excitation of one or more of the resonances by the calibration signal. A part of the recorded responses to and/or information derived from at least a part of the recorded responses is stored in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components. Processor uses the model to convert a response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.
    Type: Application
    Filed: June 26, 2023
    Publication date: December 26, 2024
    Applicants: Rohde & Schwarz GmbH & Co. KG, University of Basel
    Inventors: Thomas RUSTER, Yongqi SHI, Philipp TREUTLEIN, Melvyn HO
  • Publication number: 20240402230
    Abstract: The present disclosure relates a quantum sensor system for sensing electromagnetic, EM, radiation. The quantum sensor comprises an element configured to shape and/or focus the EM radiation to generate an inhomogeneous field distribution in an area; at least two quantum sensors which are arranged at different locations in the area, each of the quantum sensors comprising a sensing volume which is configured to interact with the EM radiation; at least one detector configured to detect an interaction of the EM radiation with each sensing volume, wherein the interaction is indicative of a power level of the EM radiation at the location of the respective sensing volume; and a processor which is configured to determine a signal characteristic of the EM radiation based on a correlation of the power levels at the locations of the sensing volumes.
    Type: Application
    Filed: June 2, 2023
    Publication date: December 5, 2024
    Applicants: Rohde & Schwarz GmbH & Co. KG, University of Basel
    Inventors: Thomas RUSTER, Philipp TREUTLEIN, Yongqi SHI, Melvyn HO
  • Patent number: 9971000
    Abstract: A device for sensing a microwave magnetic field polarization component (B?, B?, B+) of a microwave relative to a static magnetic field B0, comprising a preparation means to prepare atomic vapor (10) comprising thermal atoms in a first hyperfine state, particularly a dark state to applied laser light, which first hyperfine state is split from other hyperfine state due to zero-field hyperfine splitting and/or due to a static magnetic field (B0) generated by preparation means, at least one cell enclosing the thermal atoms (10), the microwave is adapted to drive Rabi oscillations of thermal atoms between first hyperfine state and second hyperfine state, Rabi frequency of Rabi oscillations being proportional to magnetic field polarization component (B?, B?, B+) of the microwave, and imaging means to capture state image of plurality of atoms representing spatial atomic density distribution (Ne) as a function of the Rabi frequency (?i(r)) of Rabi oscillations.
    Type: Grant
    Filed: March 23, 2013
    Date of Patent: May 15, 2018
    Assignee: UNIVERSITAT BASEL
    Inventors: Pascal Bohi, Max F. Riedel, Theodor W. Hansch, Philipp Treutlein
  • Publication number: 20150048824
    Abstract: The invention relates to a device for sensing a microwave magnetic field polarization component (B?, B?, B+,) of a microwave relative to a static magnetic field B0, comprising: a preparation means being designed to prepare an atomic vapor (10) comprising a plurality of thermal atoms in a first hyperfine state, particularly a dark state to applied laser light, which first hyperfine state is split from at least one other hyperfine state due to the zero-field hyperfine splitting and/or due to a static magnetic field (B0) generated by said preparation means, at least one cell (1) enclosing said plurality of thermal atoms (10), wherein said microwave is adapted to drive Rabi oscillations of said plurality of thermal atoms between said first hyperfine state and a second hyperfine state, the Rabi frequency of said Rabi oscillations being proportional to said magnetic field polarization component (B?, B?, B+) of said microwave, and an imaging means being designed to capture a state image of said plurality of atoms re
    Type: Application
    Filed: March 23, 2013
    Publication date: February 19, 2015
    Applicant: UNIVERSITAT BASEL
    Inventors: Pascal Bohi, Max F. Riedel, Theodor W. Hansch, Philipp Treutlein
  • Patent number: 8310230
    Abstract: A method for sensing a microwave magnetic field polarization component of a microwave field generated by a microwave device, comprises the steps of generating a static magnetic field having a predetermined amplitude and a predetermined direction relative to the microwave magnetic field polarization component to be sensed, preparing an atom cloud of ultracold probe atoms in defined hyperfine levels, wherein the hyperfine levels of the probe atoms are split in transition frequencies by the static magnetic field, applying a microwave pulse including the microwave magnetic field polarization component to be sensed to the atom cloud, wherein a spatial state distribution of the probe atoms is created by Rabi oscillations during the microwave pulse between the hyperfine levels of the probe atoms being resonant with the microwave magnetic field polarization component, and collecting a state image of the probe atoms, said state image depending on the spatial state distribution of the probe atoms and representing the m
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: November 13, 2012
    Assignees: Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V., Ludwig-Maximillians-Universitat Munchen
    Inventors: Theodor W. Haensch, Pascal Boehi, Max Riedel, Philipp Treutlein
  • Publication number: 20110234219
    Abstract: A method for sensing a microwave magnetic field polarization component of a microwave field generated by a microwave device, comprises the steps of generating a static magnetic field having a predetermined amplitude and a predetermined direction relative to the microwave magnetic field polarization component to be sensed, preparing an atom cloud of ultracold probe atoms in defined hyperfine levels, wherein the hyperfine levels of the probe atoms are split in transition frequencies by the static magnetic field, applying a microwave pulse including the microwave magnetic field polarization component to be sensed to the atom cloud, wherein a spatial state distribution of the probe atoms is created by Rabi oscillations during the microwave pulse between the hyperfine levels of the probe atoms being resonant with the microwave magnetic field polarization component, and collecting a state image of the probe atoms, said state image depending on the spatial state distribution of the probe atoms and representing the m
    Type: Application
    Filed: March 23, 2010
    Publication date: September 29, 2011
    Applicants: MAX-PLANCK-GESELLSCHAFT ZUR FORDERUNG DER WISSENSCHAFTEN E.V., LUDWIG-MAXIMILIANS-UNIVERSITAT MUNCHEN
    Inventors: Pascal Boehi, Max Riedel, Theodor W. Haensch, Philipp Treutlein