Abstract: In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.

Abstract: In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.

Abstract: A device for detecting or evaluating articles or products, irradiated by a laser beam, for generation of Raman or fluorescence radiation on surfaces of them, and generated radiation is directed to a detector array designed for locally resolved detection of the radiation. Monochromatic electromagnetic radiation with no influence on Raman or fluorescence radiation is directed at the articles or products. Detectors detect radiation reflected or scattered by articles or products in a locally resolved manner. An optical filter or beam splitter is arranged between articles or products and detector array. Irradiation and detection are carried out during relative movement between articles or products, focal range of the laser beam, diodes emitting electromagnetic radiation and detectors of the detector array. Detectors are connected to an electronic evaluation unit designed for locally and spectrally resolved evaluation of detected intensities of Raman or fluorescence radiation and for image analysis.

Abstract: In the arrangement for determining the achievable adhesive strength before forming a connection having material continuity to a surface of a joining partner, a plurality of detectors are present and arranged that are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and are connected to an electronic evaluation unit. They can detect radiation emitted from a broadband radiation source of a reflection incident on the surface of one of the joining partners, and/or after passing through joining partners transparent for the electromagnetic radiation on the detectors. A laterally and temporally homogeneous intensity of the electromagnetic radiation should be observed in this respect. The joining partner is formed from a material that does not 100% absorb the respective electromagnetic radiation and thus a transmission and/or reflection is possible.

Abstract: The invention relates to an assembly for determining the permeation rate of a sample for at least one permeate, in particular water vapor, wherein multiple detectors are arranged in a row or in a row and column arrangement for the spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval. The detectors are connected to an electronic evaluation unit and are arranged such that electromagnetic radiation emitted from a broadband radiation source is incident on the detectors either after being reflected by the surface of the sample, by a layer formed on the sample, or by the surface of a layer within the sample, and/or after passing through a sample which is transparent to the electromagnetic radiation. The irradiation is carried out such that a homogeneous intensity of the electromagnetic radiation is maintained on a surface, by means of which the electromagnetic radiation is reflected or through which the radiation is transmitted.

Abstract: An arrangement for a spatially resolved determination of the specific electrical resistance and/or of the specific electrical conductivity of a sample at different positions, in which a plurality of detectors are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and is incident onto the detectors. A radiation onto a surface takes place with homogeneous intensity.

Abstract: The invention relates to an assembly for determining the permeation rate of a sample for at least one permeate, in particular water vapor, wherein multiple detectors are arranged in a row or in a row and column arrangement for the spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval. The detectors are connected to an electronic evaluation unit and are arranged such that electromagnetic radiation emitted from a broadband radiation source is incident on the detectors either after being reflected by the surface of the sample, by a layer formed on the sample, or by the surface of a layer within the sample, and/or after passing through a sample which is transparent to the electromagnetic radiation. The irradiation is carried out such that a homogeneous intensity of the electromagnetic radiation is maintained on a surface, by means of which the electromagnetic radiation is reflected or through which the radiation is transmitted.

Abstract: An arrangement for determining characteristics or parameters of a sample, or a layer formed on or in the sample, has detectors, spatially resolving spectral analysis of electromagnetic radiation within a wavelength interval, provided in rows or in a row and column arrangement, whereby electromagnetic radiation emitted from a broadband radiation source is incident on the detectors after reflecting off, and/or passing through, the sample, or layer formed on or in the sample, upon which is observed a homogeneous intensity of the electromagnetic radiation, and an electronic evaluation unit connected to the detectors compares the spatially-resolved and wavelength-resolved signals detected by the detectors with a theoretical wavelength dependent progression of the respective radiation intensities obtained through simulation or with a progression obtained by calibration on a known sample, in order to obtain information for the measurement position detected, and determine the spatially-resolved distribution of the ch

Abstract: In the arrangement for determining the achievable adhesive strength before forming a connection having material continuity to a surface of a joining partner, a plurality of detectors are present and arranged that are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and are connected to an electronic evaluation unit. They can detect radiation emitted from a broadband radiation source of a reflection incident on the surface of one of the joining partners, and/or after passing through joining partners transparent for the electromagnetic radiation on the detectors. A laterally and temporally homogeneous intensity of the electromagnetic radiation should be observed in this respect. The joining partner is formed from a material that does not 100% absorb the respective electromagnetic radiation and thus a transmission and/or reflection is possible.

Abstract: An arrangement for a spatially resolved determination of the specific electrical resistance and/or of the specific electrical conductivity of a sample at different positions, in which a plurality of detectors are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and is incident onto the detectors. A radiation onto a surface takes place with homogeneous intensity.

Abstract: The invention relates to an arrangement for determining properties and/or parameters of a sample and/or of at least one film formed on a surface of a sample. In this respect, a plurality of detectors are arranged in a row arrangement or in a row and column arrangement and are configured for the spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval. The detectors are connected to an electronic evaluation unit and are arranged such that electromagnetic radiation emitted by a broadband radiation source is incident onto the detectors either after a reflection at the surface of the sample or at a film formed on the sample or at the surface of a film within the sample and/or after passing through a sample transparent to the electromagnetic radiation. The irradiation takes place such that a homogenous intensity of the electromagnetic radiation is observed on a surface from which the electromagnetic radiation is reflected or is transmitted by the surface.

Abstract: The invention relates to a method and to an apparatus for determining the adsorption of a gas at materials. It is the object of the invention to propose possibilities for the determining of the surface properties of materials in which statements can be obtained and very small sample volumes can be examined with sufficient measurement precision, with a reduced technical plant effort and with a reduced time effort. In the invention, a sample of a material is acted on by a gas or gas mixture within a chamber which is not transparent for electromagnetic radiation in the wavelength range between 150 nm and 25 ?m. The gas or at least a gas included in a gas mixture is adsorbed at the surface of the sample and in this respect the electromagnetic radiation emitted by the sample as a consequence of the adsorption is detected by at least one optical detector which is sensitive at least in a range of the wavelength range between 150 nm and 25 ?m.