Patents by Inventor Philippe Debosque

Philippe Debosque has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11520654
    Abstract: A method of performing a system watchdog operation of a data processing system using a system watchdog timer includes creating an initial question, starting a timer of the system watchdog timer, receiving an initial answer and an initial data code, calculating an expected data code in response to the initial question, and comparing the initial data code to the expected data code. In response to a mismatch between the initial data code and the expected data code, a bus error signal is generated. In response to a match, the initial answer is compared to the initial question, and in response to a match between the initial answer and the initial question, the timer is reset and the initial data code is stored as a subsequent question, but in response to a mismatch, a remedial action of the data processing system is performed.
    Type: Grant
    Filed: February 3, 2021
    Date of Patent: December 6, 2022
    Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
    Inventors: Philippe Debosque, Cornelis Hermanus Voorwinden, Philippe Quarmeau
  • Patent number: 9897644
    Abstract: A method of testing a semiconductor device against electrostatic discharge includes operating the semiconductor device, and, while operating the semiconductor device, monitoring a functional performance of the semiconductor device. The monitoring includes monitoring one or more signal waveforms of respective one or more signals on respective one or more pins of the semiconductor device to obtain one or more monitor waveforms, and monitoring one or more register values of one or more registers of the semiconductor device to obtain one or more monitor register values as function of time. The method includes applying an electrostatic discharge event to the semiconductor device while monitoring the functional performance of the semiconductor device. The method can further comprise determining a functional change from the one or more monitor waveforms and the one or more monitor register values as function of time.
    Type: Grant
    Filed: October 10, 2012
    Date of Patent: February 20, 2018
    Assignee: NXP USA, Inc.
    Inventors: Alain Salles, Patrice Besse, Stephane Compaing, Philippe DeBosque
  • Patent number: 7500033
    Abstract: A Universal Serial Bus transmitter comprising a USBTXP input and a USBTXM input for receiving respective data signals, and a USBP driver and a USBM driver for applying the respective data signals to USBP and USBM wires respectively. The transmitter comprises a transmit signal generator responsive to an asserting edge of a signal at one of the USBP and USBM inputs to define a leading edge of a transmit signal (USBTXIP) and to a corresponding de-asserting edge of a signal at the other of the USBP and USBM inputs to define the subsequent trailing edge of said transmit signal (USBTXIP). Even if the duty cycles of the input signals USBTXP and USBTXM are substantially different from 50%, this does not cause unacceptable jitter of successive crossover points nor cause the crossover point voltage level to be outside the USB tolerance, centred on 50% of the voltage swings of the USBP and USBM signals.
    Type: Grant
    Filed: February 6, 2005
    Date of Patent: March 3, 2009
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Vincent Teil, Philippe Debosque, Cor H. Voorwinden
  • Publication number: 20080195792
    Abstract: A Universal Serial Bus transmitter comprising a USBTXP input and a USBTXM input for receiving respective data signals, and a USBP driver and a USBM driver for applying the respective data signals to USBP and USBM wires respectively. The transmitter comprises a transmit signal generator responsive to an asserting edge of a signal at one of the USBP and USBM inputs to define a leading edge of a transmit signal (USBTXIP) and to a corresponding de-asserting edge of a signal at the other of the USBP and USBM inputs to define the subsequent trailing edge of said transmit signal (USBTXIP). Even if the duty cycles of the input signals USBTXP and USBTXM are substantially different from 50%, this does not cause unacceptable jitter of successive crossover points nor cause the crossover point voltage level to be outside the USB tolerance, centred on 50% of the voltage swings of the USBP and USBM signals.
    Type: Application
    Filed: February 6, 2005
    Publication date: August 14, 2008
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Vincent Teil, Philippe Debosque, Cor H. Voorwinden