Patents by Inventor Philippe Garreau

Philippe Garreau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10588538
    Abstract: The invention relates to a medical imaging system having microwave emitting antennas and antennas for receiving the electromagnetic field, which are arranged around a space for receiving a human tissue medium to be observed, and comprising: an array (3) of emitting antennas and an array (4) of receiving antennas, wherein said two arrays (3, 4) are independent, and motors capable of angularly rotating and of translating the emitting array (3) and/or the receiving array (4) relative to the space under observation, in order to enable the scanning thereof.
    Type: Grant
    Filed: June 6, 2014
    Date of Patent: March 17, 2020
    Assignees: MVG INDUSTRIES, OFFICE NATIONAL D'ETUDES ET RECHERCHES AEROSPATIALES (ONERA)
    Inventors: Juan Carlos Castelli, Luc Duchesne, Virginie Tessier, Ludovic Durand, Philippe Garreau, Nicolas Adnet, Stéphane Thiébaut
  • Publication number: 20160120439
    Abstract: The invention relates to a medical imaging system having microwave emitting antennas and antennas for receiving the electromagnetic field, which are arranged around a space for receiving a human tissue medium to be observed, and comprising: an array (3) of emitting antennas and an array (4) of receiving antennas, wherein said two arrays (3, 4) are independent, and motors capable of angularly rotating and of translating the emitting array (3) and/or the receiving array (4) relative to the space under observation, in order to enable the scanning thereof.
    Type: Application
    Filed: June 6, 2014
    Publication date: May 5, 2016
    Applicants: MVG INDUSTRIES, OFFICE NATIONAL D'ETUDES ET RECHERCHES AEROSPATIALES (ONERA)
    Inventors: Juan Carlos Castelli, Luc Duchesne, Virginie Tessier, Ludovic Durand, Philippe Garreau, Nicolas Adnet, Stéphane Thiébaut
  • Patent number: 9267967
    Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes, a structure for supporting the network of probes and a support for supporting the object being tested. According to the invention, the structure is closed in the three dimensions of space all around the support for the object being tested by at least one conductive wall forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers located in the intervals between the probes.
    Type: Grant
    Filed: October 7, 2011
    Date of Patent: February 23, 2016
    Assignee: Satimo Industries
    Inventors: Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
  • Patent number: 9201109
    Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
    Type: Grant
    Filed: February 17, 2009
    Date of Patent: December 1, 2015
    Assignee: Microwave Vision
    Inventors: Philippe Garreau, Per Iversen, Arnaud Gandois, Luc Duchesne
  • Patent number: 8681046
    Abstract: This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.
    Type: Grant
    Filed: January 19, 2010
    Date of Patent: March 25, 2014
    Assignees: Microwave Vision, Centre National d'Etudes Spatiales
    Inventors: Patrick Dumon, Philippe Garreau, Marc Le Goff, Luc Duchesne
  • Publication number: 20130207680
    Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes (2), a structure (3) for supporting the network of probes (2) and a support (4) for supporting the object being tested. According to the invention, the structure (3) is closed in the three dimensions of space all around the support (4) for the object being tested by at least one conductive wall (31) forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers (5) located in the intervals between the probes (2).
    Type: Application
    Filed: October 7, 2011
    Publication date: August 15, 2013
    Applicant: SATIMO INDUSTRIES
    Inventors: Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
  • Patent number: 8482294
    Abstract: A device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200). The device includes at least a sliding element (301) to provide for the relative sliding of the object being tested (200) or of the electromagnetic probe network (100), to move the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which is provided a rotation device (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.
    Type: Grant
    Filed: June 23, 2009
    Date of Patent: July 9, 2013
    Assignee: Microwave Vision
    Inventors: Philippe Garreau, Per Iversen, Luc Duchesne, Arnaud Gandois
  • Patent number: 8093912
    Abstract: The invention relates to a device for controlling a material, the device including at least one transmitter for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and one receiver for receiving the electromagnetic signal, wherein the device further includes a first modulator for modulating the electromagnetic signal at a frequency Fm1, the first modulator being arranged, on the signal path, between the transmitter and the material in order to spatially sample the emitted electromagnetic signal; second modulator for modulating the electromagnetic signal at a frequency Fm2, the second modulator being arranged, on the signal path, between the material and the electromagnetic signal receiver in order to spatially sample the electromagnetic signal passed through the material.
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: January 10, 2012
    Assignee: Ste d'Applications Technologiques de l'Imagerie Micro-Onde
    Inventors: Philippe Garreau, Jérôme Drean, Luc Duchesne, Arnaud Gandois, Ludovic Durand, Virginie Tessier, Per Iversen, Nicolas Robic
  • Publication number: 20110279320
    Abstract: This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.
    Type: Application
    Filed: January 19, 2010
    Publication date: November 17, 2011
    Applicants: CENTRE NATIONAL D'ETUDES SPATIALES, MICROWAVE VISION
    Inventors: Patrick Dumon, Philippe Garreau, Marc Le Goff, Luc Duchesne
  • Patent number: 8022884
    Abstract: The invention relates to an antenna that produces a radiation pattern that is axisymmetric about a geometrical axis (X) and exhibits a radiation maximum in a plane perpendicular to the direction of said X axis that includes a feed wire extending along said axis (X) from a first end situated level with a conducting surface forming an earth plane of the antenna to a second end that feeds a set of N radiating strands, N being an integer, characterized in that it also includes at least one earth return rod for the strands, said rod linking one of the radiating strands of the set to the earth plane.
    Type: Grant
    Filed: February 1, 2007
    Date of Patent: September 20, 2011
    Assignees: STE d Applications Technologiques de l Imagerie Micro-Onde, Centre National d Etudes Spatiales
    Inventors: Patrick Dumon, Luc Duchesne, Marc Le Goff, Nicolas Gross, Philippe Garreau
  • Publication number: 20110121839
    Abstract: The invention relates to a device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200), wherein said device includes at least a means (301) or the relative sliding of the object being tested (200) and of the electromagnetic probe network (100), capable of moving the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which are provided a means (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.
    Type: Application
    Filed: June 23, 2009
    Publication date: May 26, 2011
    Inventors: Arnaud Gandois, Luc Duchesne, Per Iversen, Philippe Garreau
  • Publication number: 20100320996
    Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
    Type: Application
    Filed: February 17, 2009
    Publication date: December 23, 2010
    Applicant: Microwave Vision
    Inventors: Philippe Garreau, Per Iversen, Arnaud Gandois, Luc Duchesne
  • Patent number: 7782262
    Abstract: The invention relates to a device for controlling the specific absorption rate of mass-produced radiant objects. The inventive device is characterized in that it comprises: at least one sensor for measuring a power radiated by an object which is located in the zone, and at least one processing unit for analyzing the power thus measured. The aforementioned sensor consist of a waveguide comprising an opening which is disposed opposite the test zone and at least one measuring probe which is disposed inside the waveguide.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: August 24, 2010
    Assignee: Societe d'Applications Technologiques de l'Imagerie Micro Ondes
    Inventors: Philippe Garreau, Luc Duchesne, Jean-Charles Bolomey
  • Publication number: 20100005891
    Abstract: The invention relates to a device for controlling a material, said device comprising at least means for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and means for receiving the electromagnetic signal, characterized in that said device further comprises first means for modulating the electromagnetic signal at a frequency Fm1, said modulation means being arranged, on the signal path, between the transmission means and the material in order to spatially sample the emitted electromagnetic signal; second means for modulating the electromagnetic signal at a frequency Fm2, said modulation means being arranged, on the signal path, between the material and the electromagnetic signal reception means in order to spatially sample the electromagnetic signal passed through the material.
    Type: Application
    Filed: September 25, 2007
    Publication date: January 14, 2010
    Applicant: STE D'APPLICATIONS TECHNOLOGIES DE L'IMAGERIE MICRO-ONDE
    Inventors: Philippe Garreau, Jérôme Drean, Luc Duchesne, Arnaud Gandois, Ludovic Durand, Virginie Tessier, Per Iversen, Nicolas Robic
  • Publication number: 20090002254
    Abstract: The invention relates to an antenna that produces a radiation pattern that is axisymmetric about a geometrical axis (X) and exhibits a radiation maximum in a plane perpendicular to the direction of said X axis that includes a feed wire extending along said axis (X) from a first end situated level with a conducting surface forming an earth plane of the antenna to a second end that feeds a set of N radiating strands, N being an integer, characterized in that it also includes at least one earth return rod for the strands, said rod linking one of the radiating strands of the set to the earth plane.
    Type: Application
    Filed: February 1, 2007
    Publication date: January 1, 2009
    Inventors: Patrick Dumon, Luc Duchesne, Marc Le Goff, Nicolas Gross, Philippe Garreau
  • Patent number: 7466142
    Abstract: An apparatus for studying the electromagnetic behavior of an electromagnetic wave-emitting or electromagnetic wave-receiving tool is provided. An anechoic chamber is configured to receive the tool as well as a person handling the tool. At least one analysis antenna is configured to pick-up the electromagnetic waves emitted from or received by the tool. Signals outputted by the analysis antenna are processed, and a radiation diagram associated with the electromagnetic tool is displayed. The radiation diagram is displayed inside the anechoic chamber so that the person handling the electromagnetic tool observes how the handling of the tool affects its electromagnetic behavior.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: December 16, 2008
    Assignee: Ste d'Applications Technologiques de l'Imagerie Micro Ondes
    Inventors: Philippe Garreau, Luc Duchesne, Per Olav Iversen, Arnaud Gandois
  • Patent number: 7443170
    Abstract: A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: October 28, 2008
    Assignee: Ste D'Applications Technologies de L'Imagerie Micro Ondes
    Inventors: Philippe Garreau, Luc Duchesne, Per Olav Iversen, Arnaud Gandois
  • Publication number: 20070063905
    Abstract: The invention relates to a device for controlling the specific absorption rate of mass-produced radiant objects. The inventive device is characterised in that it comprises: at least one sensor for measuring a power radiated by an object which is located in the zone, and at least one processing unit for analysing the power thus measured. The aforementioned sensor consist of a waveguide comprising an opening which is disposed opposite the test zone and at least one measuring probe which is disposed inside the waveguide.
    Type: Application
    Filed: August 18, 2004
    Publication date: March 22, 2007
    Applicant: SOICETE D'APPLICATION TECHNOLOGIQUES DE
    Inventors: Philippe Garreau, Luc Duchesne, Jean-Charles Bolomey
  • Publication number: 20070018654
    Abstract: The invention relates to an arrangement for measuring the radiation of an electromagnetic device, said arrangement essentially comprising a support (20) for positioning said device, an arc (10), a network of measuring probes that are distributed over the arc (10), essentially describing a circle which is centred on the support, and means for driving the device in rotation between the support (20) and the arc (10), about a geometrical axis merged into the plane of the arc (10). The inventive arrangement is characterised in that the device support (20) and the arc (10) can also be pivoted about a geometrical axis that is transversal to the plane of the arc (10), the device including means for holding the support (20) and the arc (10) in the selected position after rotation about the second geometrical axis.
    Type: Application
    Filed: August 13, 2004
    Publication date: January 25, 2007
    Applicant: SOCIETE D'APPLICATIONS TECHNOLOIQUES DE L'IMAGERIE
    Inventors: Philippe Garreau, Luc Duchesne, Per Iversen, Arnaud Gandois
  • Publication number: 20060208746
    Abstract: The invention relates to a system which is used to study the electromagnetic behaviour of an antenna or any other wave-emitting or -receiving tool. The inventive system comprises an anechoic chamber which is designed to receive one such electromagnetic tool (10) to be studied as well as the person handling said tool (10). The invention also comprises: at least one analysis antenna (20) which is used to pick up the waves emitted or received by the electromagnetic tool to be studied (10), and means (30) for processing the output signals from said analysis antenna (20). The system further comprises means (40) for displaying a radiation pattern produced for the electromagnetic tool to be studied (10). The invention is characterised in that the radiation pattern display means (40) are disposed inside the anechoic chamber, such that the person handling the electromagnetic tool to be studied (10) can directly observe the effect of his/her handling of the tool (10) on the electromagnetic behaviour thereof.
    Type: Application
    Filed: August 18, 2004
    Publication date: September 21, 2006
    Inventors: Philippe Garreau, Luc Duchesne, Per Iverson, Arnaund Gandois