Abstract: The present invention relates to a method of characterizing a surface and to a device for implementing this method. In particular, this method makes it possible to measure, qualitatively and/or quantitatively, interactions that may be physical, chemical, biochemical or biological.

Abstract: The present invention relates to a method of characterizing a surface and to a device for implementing this method. In particular, this method makes it possible to measure, qualitatively and/or quantitatively, interactions that may be physical, chemical, biochemical or biological.

Abstract: The invention concerns a method for characterising the surface of a sensitive layer deposited on the base of an optical prism, said surface comprising active zones whereof the optical thickness is capable of varying with time, said method using a technique based on analysis of the reflective variation of the prism-sensitive layer interface. The method consists in causing: a collimated light beam with an angle of incidence enabling total reflection on the prism base to penetrate into the prism, said beam illuminating a fixed part of the interface corresponding to the part to be characterised; scanning at an angle so as to locate an incidence whereon the reflectivity of the active zones is minimal; determining an angle of incidence optimal for sensitivity of detection of the active zones; adjusting the incidence to the optimal value; and measuring the reflectivity with an imaging system. The invention also concerns a device for implementing said method.