Patents by Inventor Philippe Langois

Philippe Langois has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240275809
    Abstract: Systems and methods for testing, evaluating, and scoring IT products (e.g., software) and product updates from a technology provider are disclosed herein. More specifically, organizational assessment may be performed to evaluate the provider's development lifecycle processes and generate organization maturity scores. Architecture assessment may be performed to evaluate the system-level and software-level architectures associated with the application and generate architecture maturity scores. Product verification may be performed via automated testing and penetration testing to generate verification maturity scores. The organization maturity scores, architecture maturity scores, and verification maturity scores may be used to provide recommendations to the provider and also combined into an overall maturity score, which may serve as a comprehensive summary of the evaluation. These generated scores inform and expedite testing of future iterations of the product.
    Type: Application
    Filed: February 13, 2024
    Publication date: August 15, 2024
    Inventors: Brian Joseph Glas, John Dzuirlaj, Michael Erik Garcia, Philippe Langois, Jared Kelley Marcotte, Katharina Elizabeth Owens Hubler, Aaron Wilson
  • Patent number: 9759687
    Abstract: A method and a device for detecting defects in a packaging laminate having at least one conductive layer are provided. The method comprises the steps of grounding the conductive layer of the packaging laminate, arranging an electrode adjacent to the packaging laminate, applying a high voltage to the electrode by ramping the voltage from an initial value towards an upper predetermined value, and detecting a defect in the packaging material by registering dielectric breakdown between the electrode and the conductive layer of the packaging laminate.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: September 12, 2017
    Assignee: TETRA LAVAL HOLDINGS & FINANCE S.A.
    Inventors: Philippe Langois, Hans Hallstadius
  • Publication number: 20140009169
    Abstract: A method and a device for detecting defects in a packaging laminate having at least one conductive layer are provided. The method comprises the steps of grounding the conductive layer of the packaging laminate, arranging an electrode adjacent to the packaging laminate, applying a high voltage to the electrode by ramping the voltage from an initial value towards an upper predetermined value, and detecting a defect in the packaging material by registering dielectric breakdown between the electrode and the conductive layer of the packaging laminate.
    Type: Application
    Filed: December 22, 2011
    Publication date: January 9, 2014
    Applicant: Tetra Laval Holdings & Finance S.A.
    Inventors: Philippe Langois, Hans Hallstadius