Patents by Inventor Philippe Nobert

Philippe Nobert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample support for desorption
    Patent number: 7582863
    Abstract: An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output of which it is ionized by corona discharge or photo-ionization. The obtained ionized sample may be analyzed in a mass spectrometer or used to serve any other appropriate purpose.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: September 1, 2009
    Assignee: Phytronix Technologies, Inc.
    Inventors: Pierre Picard, Andre L'heureux, Jean Lacoursiere, Philippe Nobert, Sylvain Letarte, Alexandre Vallieres, Réal Paquin, Denis Lessard
  • SAMPLE SUPPORT FOR DESORPTION
    Publication number: 20080067357
    Abstract: An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output of which it is ionized by corona discharge or photo-ionization. The obtained ionized sample may be analyzed in a mass spectrometer or used to serve any other appropriate purpose.
    Type: Application
    Filed: November 28, 2007
    Publication date: March 20, 2008
    Applicant: Phytronix Technologies, Inc.
    Inventors: Pierre Picard, Andre L'heureux, Jean Lacoursiere, Philippe Nobert, Sylvain Letarte, Alexandre Vallieres, Robert Tiveron, Real Paquin, Denis Lessard
  • Ionization source for mass spectrometer
    Patent number: 7321116
    Abstract: An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output of which it is ionized by corona discharge or photo-ionization. The obtained ionized sample may be analyzed in a mass spectrometer or used to serve any other appropriate purpose.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: January 22, 2008
    Assignee: Phytronix Technologies, Inc.
    Inventors: Pierre Picard, Denis Lessard, André L'Heureux, Jean Lacoursiere, Philippe Nobert, Sylvain Letarte, Alexandre Vallieres, Robert Tiveron, Réal Paquin
  • Ionization source for mass spectrometer
    Publication number: 20060054807
    Abstract: An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output of which it is ionized by corona discharge or photo-ionization. The obtained ionized sample may be analyzed in a mass spectrometer or used to serve any other appropriate purpose.
    Type: Application
    Filed: May 20, 2005
    Publication date: March 16, 2006
    Applicant: PHYTRONIX TECHNOLOGIES, INC.
    Inventors: Pierre Picard, Denis Lessard, Andre L'Heureux, Jean Lacoursiere, Philippe Nobert, Sylvain Letarte, Alexandre Vallieres, Robert Tiveron, Real Paquin