Abstract: The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.

Abstract: A capacitive detection system comprising a capacitive sensor having a conductive electrode disposed to generate an electric field in a detection zone when the electrode is subjected to an electric potential, and an electronic control device connected at least to the first electrode. The first electrode of the capacitive sensor is disposed substantially entirely over a conductive screen connected to the control device.

Abstract: The invention relates to a measuring device comprising at least one measuring probe (10), means for sequentially applying a controlled supply voltage between the measuring probe (10) and a reference element, and means for integrating accumulated electric charges on the measuring probe (10), characterized in that said device also comprises at least one auxiliary measuring probe (100) which is also sequentially linked to controlled electric supply means and to charge integrating means, said auxiliary measuring probe (100) having a capacity, in relation to a potential detection zone, which is different from the main measuring probe (10), whereby comparative utilization of signals respectively emitted by the two measuring probes (10,100) enables the influence of the main measuring probe to be determined.

Abstract: The invention concerns a measurement device comprising at least a measuring probe (10), means (30) for sequentially applying a controlled supply voltage between the measuring probe (10) and a reference element (20) and means (50) for integrating the electric loads accumulated on the measuring probe (10). The invention is characterised in that it further comprises means (60) for correcting the integrating stage (50) input offset.