Patents by Inventor Philippe Perdu
Philippe Perdu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20180336162Abstract: The present disclosure relates to a method and a device for reconstructing a useful signal from an acquired signal made up of a plurality of samples representing physical quantities measured. The acquired signal includes the useful signal made noisy by a noise. The method includes decomposing the acquired signal on a predetermined wavelet decomposition base according to a given number of decomposition levels, and obtaining corresponding wavelet coefficients representing the acquired signal. The method further estimates a value representing the standard deviation of the noise from at least one portion of the wavelet coefficients; and implements an iterative method for reconstructing parsimonious signals on the acquired signal with a dictionary built from the wavelet decomposition base. The iterative method has an associated stop criterion that is calculated as a function of the value representing the estimated noise.Type: ApplicationFiled: July 31, 2018Publication date: November 22, 2018Applicants: CENTRE NATIONAL D'ETUDES SPATIALES, UNIVERSITE DE BOURGOGNEInventors: Anthony BOSCARO, Sabir JACQUIR, Stephane BINCZAK, Kevin SANCHEZ, Philippe PERDU
-
Publication number: 20120116734Abstract: The method according to the invention consists of producing a real cartography of the magnetic field radiated by the circuit placed in a predetermined operating state. It includes the following steps: a) applying a transform to an initial hypothesis on the nature of the defect, to obtain a current hypothesis, b) superimposing the current hypothesis on an initial topology of the circuit to obtain a current topology; c) simulating the magnetic field generated by the current topology, so as to obtain a current simulated cartography; d) estimating the current value of a correlation function between the measured cartography and the current simulated cartography; and e) iterating steps a) to d) to seek a maximum of the correlation function by modifying the value of said characteristic parameter of the defect.Type: ApplicationFiled: October 10, 2011Publication date: May 10, 2012Applicant: CENTRE NATIONAL D'ETUDES SPATIALESInventors: Fulvio INFANTE, Philippe PERDU
-
Publication number: 20110187352Abstract: In a method and a machine for testing an electronic device, in which the magnetic field emitted is measured by a monodirectional measurement probe, a first value of the component Bz of the magnetic field along axis ZZ? is measured by the probe and recorded. The probe and the electronic device are displaced with respect to one another by relative pivoting about an axis XX? orthogonal to axis ZZ?, according to an angular amplitude of less than 90° while maintaining distance d0 and, for each position (x, y) of axis ZZ?, a second value of component Bz of the magnetic field along axis ZZ? is measured by the probe and recorded, then the value of component By of the magnetic field along axis YY? orthogonal to axes ZZ? and XX? is determined and recorded on the basis of the first value and the second value which have been obtained.Type: ApplicationFiled: June 24, 2009Publication date: August 4, 2011Applicant: Centre National D'Etudes Spatiales (C.N.E.S.)Inventor: Philippe Perdu
-
Patent number: 7439730Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: GrantFiled: December 8, 2005Date of Patent: October 21, 2008Assignee: DCG Systems, Inc.Inventors: Romain Desplats, Patricia Le Coupanec, William K. Lo, Philippe Perdu, Steven Kasapi
-
Patent number: 7417424Abstract: A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain (28) includes elements (136) for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).Type: GrantFiled: October 8, 2004Date of Patent: August 26, 2008Assignee: Centre National d 'Etudes SpatialesInventors: Romain Desplats, Olivier Crepel, Felix Beaudoin, Philippe Perdu
-
Patent number: 7411391Abstract: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.Type: GrantFiled: October 8, 2004Date of Patent: August 12, 2008Assignee: Centre National d'Etudes SpatialesInventors: Romain Desplats, Olivier Crepel, Félix Beaudoin, Philippe Perdu
-
Patent number: 7408342Abstract: A magnetic-field-measuring probe includes at least two magnetoresistive sensors which are sensitive to respective magnetic fields along a determined measurement axis. The at least two magnetoresistive sensors are rigidly connected to one another in a position such that the measurement axes thereof are at an angle other than zero. Output terminals specific to each magnetoresistive sensor are used to supply a signal that is representative of the field measured by each sensor along the measurement axis thereof. The difference between the derivative of a first magnetic field relative to a second direction and the derivative of a second magnetic field relative to a first direction is calculated to determine a component of current to be measured.Type: GrantFiled: October 8, 2004Date of Patent: August 5, 2008Assignee: Centre National d'Etudes SpatialesInventors: Romain Desplats, Olivier Crepel, Felix Beaudoin, Philippe Perdu
-
Patent number: 7400154Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: GrantFiled: March 2, 2005Date of Patent: July 15, 2008Assignee: Credence Systems CorporationInventors: Romain Desplats, Philippe Perdu, Ketan J. Shah, Theodore R. Lundquist
-
Patent number: 7323862Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: GrantFiled: April 25, 2006Date of Patent: January 29, 2008Assignee: Credence Systems CorporationInventors: Romain Desplats, Patricia Le Coupanec, William K. Lo, Philippe Perdu, Steven Kasapi
-
Publication number: 20070132464Abstract: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.Type: ApplicationFiled: October 8, 2004Publication date: June 14, 2007Applicant: CENTRE NATIONAL D'ETUDES SPATIALESInventors: Romain Desplats, Olivier Crepel, Felix Beaudoin, Philippe Perdu
-
Publication number: 20070108975Abstract: The invention relates to a magnetic-field-measuring probe comprising at least one magnetoresistive sensor (102, 104, 106) which is sensitive to the magnetic field along a determined privileged measurement axis. The inventive probe comprises: at least two magnetoresistive sensors (102, 104, 106) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are offset angularly; and output terminals specific to each magnetoresistive sensor (102, 104, 106), in order to supply a signal that is representative of the field measured by each sensor along the privileged measurement axis thereof.Type: ApplicationFiled: October 8, 2004Publication date: May 17, 2007Applicant: CENTRE NATIONALE D' ETUDESInventors: Romain Desplats, Olivier Crepel, Felix Beaudoin, Philippe Perdu
-
Patent number: 7190822Abstract: A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vector representing the state of a common set of elements of the circuit among which the element to be customized (12); b) defining on the basis of a comparison of vectors, a composite of logic operators applied on the vectors and enabling to extract the coefficient corresponding to the element to be customized (30); c) producing images of the operating circuit at times corresponding to the vectors whereon is applied the composite of logic operators (32); and d) graphically combining the images produced in accordance with a composite of graphic operators corresponding to the composite of logic operators (36).Type: GrantFiled: June 26, 2001Date of Patent: March 13, 2007Assignee: Centre National d'Etudes SpatialesInventors: Romain Desplats, Philippe Perdu
-
Publication number: 20070052412Abstract: A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain (28) includes elements (136) for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).Type: ApplicationFiled: October 8, 2004Publication date: March 8, 2007Applicant: CENTRE NATIONAL D'ETUDES SPATIALESInventors: Romain Desplats, Olivier Crepel, Felix Beaudoin, Philippe Perdu
-
Publication number: 20060181268Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: ApplicationFiled: April 25, 2006Publication date: August 17, 2006Applicant: Credence Systems CorporationInventors: Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi
-
Publication number: 20060108997Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: ApplicationFiled: December 8, 2005Publication date: May 25, 2006Applicant: Credence Systems CorporationInventors: Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu, Steven Kasapi
-
Patent number: 7038442Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: GrantFiled: January 20, 2005Date of Patent: May 2, 2006Assignee: Credence Systems CorporationInventors: Romain Desplats, Patricia Le Coupanec, William K. Lo, Philippe Perdu, Steven Kasapi
-
Patent number: 6967491Abstract: A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.Type: GrantFiled: July 9, 2004Date of Patent: November 22, 2005Assignee: Credence Systems CorporationInventors: Philippe Perdu, Romain Desplats, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz, Kenneth R. Wilsher
-
Publication number: 20050231219Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.Type: ApplicationFiled: March 2, 2005Publication date: October 20, 2005Applicant: Credence Systems CorporationInventors: Romain Desplats, Philippe Perdu, Ketan Shah, Theodore Lundquist
-
Patent number: 6948107Abstract: The invention relates to a method and an installation for fast location of a fault in an integrated circuit. A sequence of NRZ location vectors is created, the abnormal location vectors are determined, for which the value of the electrical consumption current at rest IDDQ of the circuit is abnormal, at least one set of images is produced with an abnormal location vector, and at least one abnormal vector image is compared with a reference image.Type: GrantFiled: May 21, 1999Date of Patent: September 20, 2005Assignee: Centre National d'Etudes Spatiales (C.N.E.S.)Inventors: Romain Desplats, Philippe Perdu
-
Patent number: 6943572Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves processing of integrated circuit computer aided design data to identify transistors within the CAD data. The analysis may further involve the use of Boolean operators to process the CAD data to particularly identify, such as through a channel, the location of the NMOS and PMOS gates, the location of the drain and source, or some combination of the location of the gate and drain or source to particularly identify the pinch-off region.Type: GrantFiled: December 5, 2003Date of Patent: September 13, 2005Assignee: Credence Systems CorporationInventors: Romain Desplats, Philippe Perdu, Ketan J. Shah, Theodore R. Lundquist