Patents by Inventor Philippe Raulot

Philippe Raulot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for detecting defects in optical components
    Patent number: 8295581
    Abstract: A method is disclosed for detecting defects in an optical component to be tested, such as a lens comprising the steps of: providing a structured pattern, recording the reflected or transmitted image of the pattern on the optical component to be tested, phase shifting the pattern and recording again similarly the reflected or transmitted image, calculating the local phase and amplitude images of the optical component to be tested, calculating a model image of a defect free optical component and determining corresponding phase and amplitude images of the defect free model optical component, comparing phase and amplitude images of both optical component to be tested and defect free model optical component, determining suspect zones in the optical component to be tested, and applying a metrics to separate dust and noise from other defects.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: October 23, 2012
    Assignee: Essilor International (Compagnie Generale d'optique)
    Inventors: Frédéric Dubois, Fabrice Gibrat, Guy Schott, Philippe Raulot
  • Method and Apparatus for Detecting Defects in Optical Components
    Publication number: 20100290694
    Abstract: A method is disclosed for detecting defects in an optical component to be tested, such as a lens comprising the steps of: providing a structured pattern, recording the reflected or transmitted image of the pattern on the optical component to be tested, phase shifting the pattern and recording again similarly the reflected or transmitted image, calculating the local phase and amplitude images of the optical component to be tested, calculating a model image of a defect free optical component and determining corresponding phase and amplitude images of the defect free model optical component, comparing phase and amplitude images of both optical component to be tested and defect free model optical component, determining suspect zones in the optical component to be tested, and applying a metrics to separate dust and noise from other defects.
    Type: Application
    Filed: April 14, 2008
    Publication date: November 18, 2010
    Inventors: Frédéric Dubois, Fabrice Gibrat, Guy Schott, Philippe Raulot