Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.

Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.

Abstract: The present invention discloses an integrated circuit (200) including a module (130) for processing a radio-frequency (RF) signal during normal operation of the integrated circuit. The IC (200) has an on-chip test arrangement for generating an accurate RF test signal for testing the module (130) in a test mode. To this end, the test arrangement comprises a signal source (210) for generating a radio-frequency control signal in the test mode and a complementary transistor pair (230) arranged in series, said pair being coupled between a first supply rail and a second supply rail, and being arranged to generate the radio-frequency test signal on its output in response to the radio-frequency control signal supplied to its control terminals. The invention is based on the realization that if a stable enough supply voltage is provided to the transistor pair, the pair can be forced to produce an accurate rail-to-rail voltage swing at RF frequencies on its output.