Abstract: Methods, systems and techniques are provided to authenticate a device or system under test. A signal is injected to elicit test output measuring a physical characteristic of the type of DUT/SUT. In respective embodiments the injected signal is defined to elicit an output for time-domain or frequency-domain evaluation. A signal may comprise combinations of (non-destructive/non-activating) signals applied to multiple access points for measurement at arbitrary access points of the DUT/SUT. Test output may be from a first arbitrary subset of points and the signal injected at a second arbitrary subset, independent of the first subset, to obtain an arbitrary test output (measurement set) that treats the DUT/SUT like a network of transmission lines. In an embodiment, measurements of multiple DUT/SUTs of a same type are used to define a common profile e.g. as a classifier or statistical profile(s). Counterfeit/alternate designs, altered designs, and implants are detectable.

Abstract: Methods, systems and techniques are provided to authenticate a device under test (DUT)/system under test (SUT) comprising an electronic component(s). A profile is defined by injecting a signal to elicit an output that is responsive a physical characteristic of the type of DUT/SUT. In respective embodiments the injected signal is defined to elicit an output for time-domain or frequency-domain evaluation. An injected signal may comprise combinations of (non-destructive/non-activating) signals applied to multiple access points for measurement at arbitrary access points of the DUT/SUT. In an embodiment, measurements of multiple DUT/SUTs of a same type are used to define a common profile. In an embodiment, the profile is built using machine learning to define a classifier. In other embodiments, statistical profiles are defined. During use, output is generated for a target DUT/SUT for evaluation relative to the profile. Counterfeit/alternate designs, altered designs, and implants are detectable.

Abstract: Methods, systems and techniques are provided to authenticate a device under test (DUT)/system under test (SUT) comprising an electronic component(s). A profile is defined by injecting a signal to elicit an output that is responsive a physical characteristic of the type of DUT/SUT. In respective embodiments the injected signal is defined to elicit an output for time-domain or frequency-domain evaluation. An injected signal may comprise combinations of (non-destructive/non-activating) signals applied to multiple access points for measurement at arbitrary access points of the DUT/SUT. In an embodiment, measurements of multiple DUT/SUTs of a same type are used to define a common profile. In an embodiment, the profile is built using machine learning to define a classifier. In other embodiments, statistical profiles are defined. During use, output is generated for a target DUT/SUT for evaluation relative to the profile. Counterfeit/alternate designs, altered designs, and implants are detectable.