Patents by Inventor Phillip Coulter

Phillip Coulter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10191163
    Abstract: A method of mapping pixel locations of a detector array includes measuring a location on the detector array, initiating a frame readout of the detector array, measuring a location of one or more metrology targets on the detector array, analyzing the frame readout to identify a pixel at the location on the detector array, and defining a location of the identified pixel with respect to the location of the one or more metrology targets. Subsequent measurement of the metrology targets alone by another metrology system allows one to infer the six degree of freedom alignment of the detector array in space.
    Type: Grant
    Filed: June 8, 2016
    Date of Patent: January 29, 2019
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Phillip Coulter, Raymond Ohl, Timothy Madison
  • Publication number: 20170357003
    Abstract: A method of mapping pixel locations of a detector array includes measuring a location on the detector array, initiating a frame readout of the detector array, measuring a location of one or more metrology targets on the detector array, analyzing the frame readout to identify a pixel at the location on the detector array, and defining a location of the identified pixel with respect to the location of the one or more metrology targets. Subsequent measurement of the metrology targets alone by another metrology system allows one to infer the six degree of freedom alignment of the detector array in space.
    Type: Application
    Filed: June 8, 2016
    Publication date: December 14, 2017
    Inventors: PHILLIP COULTER, RAYMOND OHL, TIMOTHY MADISON
  • Patent number: 9109898
    Abstract: A method for corrections of measurements of points of interests measured by beams of radiation propagating through stratified media including performance of ray-tracing of at least one ray lunched from a metrology instrument in a direction of an apparent point of interest, calculation a path length of the ray through stratified medium, and determination of coordinates of true position of the point interest using the at least one path length and the direction of propagation of the ray.
    Type: Grant
    Filed: July 18, 2013
    Date of Patent: August 18, 2015
    Assignee: Sigma Space Corporation
    Inventors: Joseph Ethan Hayden, David Albert Kubalak, Theodore John Hadjimichael, Bente Hoffmann Eegholm, Raymond George Ohl, IV, Randal Crawford Telfer, Phillip Coulter
  • Publication number: 20150092177
    Abstract: A method for corrections of measurements of points of interests measured by beams of radiation propagating through stratified media including performance of ray-tracing of at least one ray lunched from a metrology instrument in a direction of an apparent point of interest, calculation a path length of the ray through stratified medium, and determination of coordinates of true position of the point interest using the at least one path length and the direction of propagation of the ray.
    Type: Application
    Filed: July 18, 2013
    Publication date: April 2, 2015
    Inventors: Joseph Ethan Hayden, David Albert Kubalak, Theodore John Hadjimichael, Bente Hoffmann Eegholm, Raymond George Ohi, IV, Randal Crawford Telfer, Phillip Coulter