Abstract: A measurement test instrument voltage management system for an accessory device has a accessory device interface that provides a voltage to a memory device in the accessory device. A sensing signal is generated when the accessory device is connected to the interface that causes an interrupt signal to be coupled to a controller. The controller retrieves accessory device data stored in the device memory via the interface and determines if the connected accessory device is a valid device capable of being supported by the measurement test instrument and voltage power requirements for the accessory device. The controller generates an enable signal for a valid and supported device that is coupled to a voltage switching circuit. The voltage switching circuit generates at least a first output voltage based on the voltage power requirements that is coupled to the accessory device via the interface to provide power to the accessory device.

Abstract: A measurement test instrument voltage management system for an accessory device has a accessory device interface that provides a voltage to a memory device in the accessory device. A sensing signal is generated when the accessory device is connected to the interface that causes an interrupt signal to be coupled to a controller. The controller retrieves accessory device data stored in the device memory via the interface and determines if the connected accessory device is a valid device capable of being supported by the measurement test instrument and voltage power requirements for the accessory device. The controller generates an enable signal for a valid and supported device that is coupled to a voltage switching circuit. The voltage switching circuit generates at least a first output voltage based on the voltage power requirements that is coupled to the accessory device via the interface to provide power to the accessory device.

Abstract: An attachable/detachable probe point for use with an electrical measurement probe includes a base having a aperture formed therein that extends through the base. An electrically conductive probing contact having at least a partially threaded body member and a pointed contact member is disposed in the aperture with a portion of the body member extending from the top surface of the base and the pointed contact member extendable from a first position within the aperture to a second protruding position outside the aperture at the bottom surface of the base. A compliant adhesive material formed on the bottom surface of the base for securing the attachable/detachable probe point to probing contact point.