Abstract: An apparatus and method for automated diagnostic testing of an electronic device assembly so that functional testing, collection of test results, diagnosis for identifying potentially failed components in the device assembly is a software controlled automated process. In one embodiment of the present invention, a component-level block diagram is coupled to the controllable devices in the device assembly so that an operator can set up and conduct the functional testing of the device assembly. The diagram is also updated with the generated test data for displaying to the user potentially failed components and other information for helping the user to diagnose and to troubleshoot the situation.

Abstract: A method and apparatus for controlling elements in an electronic device is via a graphical block diagram of the electronic device which displays the elements. The block diagram is coupled to the electronic device so that an operator controls the elements via the block diagram. In one embodiment of the invention, the operator uses the block diagram for selecting a combination of components and latches in the electronic device for establishing prescribed signal paths connecting the combination.